Corrections to preaveraging approximation within the Kirkwood–Riseman model for flexible polymers: Calculations to second order in ε with both hydrodynamic and excluded volume interactions

1986 ◽  
Vol 85 (6) ◽  
pp. 3674-3687 ◽  
Author(s):  
Shi‐Qing Wang ◽  
Jack F. Douglas ◽  
Karl F. Freed
1987 ◽  
Vol 109 ◽  
Author(s):  
James F. Wolfe ◽  
Bock H. Loo ◽  
Robert A. Sanderson ◽  
Steven P. Bitler

ABSTRACTThe synthesis of three types of functionalized benzazole structures is described. A centrosymmetric dihydroxy-benzobisthiazole has been synthesized for incorporation in flexible polymers having rigid, conjugated, third order nlo active units in the main chain. Benzazole structures terminated with an N,N-dimethylamino group and a carboxyl group have been synthesized for use as second order nlo pendants with flexible polymers. Benzazole structures terminated with an N,N-dimethylamino group and an amino group have been synthesized as precursors to second order nlo guest molecules.


1985 ◽  
Vol 18 (12) ◽  
pp. 2464-2474 ◽  
Author(s):  
Shi Qing Wang ◽  
Jack F. Douglas ◽  
Karl F. Freed

1987 ◽  
Vol 20 (3) ◽  
pp. 543-551 ◽  
Author(s):  
Jack F. Douglas ◽  
Shi Qing Wang ◽  
Karl F. Freed

2006 ◽  
Vol 38 (7) ◽  
pp. 643-650 ◽  
Author(s):  
Masashi Osa ◽  
Nobuo Sawatari ◽  
Takenao Yoshizaki ◽  
Hiromi Yamakawa

Author(s):  
W. L. Bell

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.


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