The photoelectron spectrum of water in the 30 to 140 eV photon energy range

1986 ◽  
Vol 84 (9) ◽  
pp. 4739-4744 ◽  
Author(s):  
M. S. Banna ◽  
B. H. McQuaide ◽  
R. Malutzki ◽  
V. Schmidt
1994 ◽  
Author(s):  
Karl-Heinz Stephan ◽  
Claus Reppin ◽  
Hans-Joerg Maier ◽  
Dagmar Frischke ◽  
Detlef Fuchs ◽  
...  

2012 ◽  
Vol 393 (1) ◽  
pp. 107-116 ◽  
Author(s):  
Martin Schwell ◽  
Yves Bénilan ◽  
Nicolas Fray ◽  
Marie-Claire Gazeau ◽  
Et. Es-Sebbar ◽  
...  

2018 ◽  
Vol 112 ◽  
pp. 11-15 ◽  
Author(s):  
Maria Christiansson ◽  
Christian Bernhardsson ◽  
Therése Geber-Bergstrand ◽  
Sören Mattsson ◽  
Christopher L. Rääf

1989 ◽  
Vol 44 (1) ◽  
pp. 17-20 ◽  
Author(s):  
G. Hagenow ◽  
H.-W. Jochims ◽  
J. Sawatzki ◽  
R. Minkwitz ◽  
H. Baumgärtel

Abstract The ionization potential of CH3SCF3 and the appearance potentials of fragment ions have been measured in the photon energy range 9 -19 eV using synchrotron, radiation. From these results thermochemical data of CH3SCF3, CH3SCF3+ and fragment ions have been evaluated.


2016 ◽  
Vol 24 (13) ◽  
pp. 14546 ◽  
Author(s):  
Masatoshi Hatayama ◽  
Satoshi Ichimaru ◽  
Tadayuki Ohcni ◽  
Eiji J. Takahashi ◽  
Katsumi Midorikawa ◽  
...  

2018 ◽  
Vol 25 (3) ◽  
pp. 878-884 ◽  
Author(s):  
Hyun-Joon Shin ◽  
Namdong Kim ◽  
Hee-Seob Kim ◽  
Wol-Woo Lee ◽  
Chae-Soon Lee ◽  
...  

A scanning transmission X-ray microscope is operational at the 10A beamline at the Pohang Light Source. The 10A beamline provides soft X-rays in the photon energy range 100–2000 eV using an elliptically polarized undulator. The practically usable photon energy range of the scanning transmission X-ray microscopy (STXM) setup is from ∼150 to ∼1600 eV. With a zone plate of 25 nm outermost zone width, the diffraction-limited space resolution, ∼30 nm, is achieved in the photon energy range up to ∼850 eV. In transmission mode for thin samples, STXM provides the element, chemical state and magnetic moment specific distributions, based on absorption spectroscopy. A soft X-ray fluorescence measurement setup has been implemented in order to provide the elemental distribution of thicker samples as well as chemical state information with a space resolution of ∼50 nm. A ptychography setup has been implemented in order to improve the space resolution down to 10 nm. Hardware setups and application activities of the STXM are presented.


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