Study of CS2 in the 3–10 eV energy range by electron energy loss spectroscopy

1983 ◽  
Vol 78 (3) ◽  
pp. 1200-1212 ◽  
Author(s):  
M.‐J. Hubin‐Franskin ◽  
J. Delwiche ◽  
A. Poulin ◽  
B. Leclerc ◽  
P. Roy ◽  
...  
1998 ◽  
Vol 05 (01) ◽  
pp. 427-431 ◽  
Author(s):  
Susanne Siebentritt ◽  
Roland Pues ◽  
Karl-Heinz Rieder ◽  
Alexander M. Shikin

Using high resolution electron energy loss spectroscopy (HREELS) the surface phonon dispersion of graphite has been determined in the Γ K direction over the whole energy range and the whole Brillouin zone. By depositing lanthanum and annealing we prepared a GIC-like phase which grows on top of an intermediate carbide. The phonon dispersion of this phase shows the same modes as graphite, but the optical ones are softened and the acoustical ones are stiffened. This is described within a Born-von Karman model. The evolution of the phonon dispersion gives a first hint that the GIC-like phase may develop in two stages: first a monolayer graphite on top of the carbide and then the very thin GIC layer.


1993 ◽  
Vol 8 (10) ◽  
pp. 2627-2633 ◽  
Author(s):  
G. Mondio ◽  
F. Neri ◽  
G. Curró ◽  
S. Patané ◽  
G. Compagnini

The dielectric constant of tetracyanoquinodimethane (TCNQ) single crystals has been obtained by reflection electron energy loss spectroscopy (REELS) over the 0–60 eV energy range, using primary electron energies ranging from 0.5 to 1.5 keV at an incidence angle of about 40°. A self-consistent method is discussed concerning the evaluation of the surface and bulk contributions to the loss spectra. As a result, for the first time, the Im(−1/∊) function and the dielectric constant of TCNQ have been deduced in such a wide energy range. According to the results obtained by other authors, the low-energy loss spectral profile is characterized by two main structures ascribed to the π → π∗ dipole-allowed transitions located at about 3.5 and 6.5 eV while, at higher energy loss, the π + σ plasmon, centered at about 21.5 eV, dominates the spectrum. The differences among the spectra taken at different primary energies are interpreted as due only to surface effects, more evident in the low-energy-loss spectral region. The results are in good agreement with those obtained by recent transmission-mode (TEELS) experiments.


1985 ◽  
Vol 82 (4) ◽  
pp. 1797-1803 ◽  
Author(s):  
M. Furlan ◽  
M‐J. Hubin‐Franskin ◽  
J. Delwiche ◽  
D. Roy ◽  
J. E. Collin

1983 ◽  
Vol 14 (19) ◽  
Author(s):  
M.-J. HUBIN-FRANSKIN ◽  
J. DELWICHE ◽  
A. POULIN ◽  
B. LECLERC ◽  
P. ROY ◽  
...  

2012 ◽  
Vol 100 (19) ◽  
pp. 193902 ◽  
Author(s):  
B. Paik ◽  
A. Walton ◽  
V. Mann ◽  
D. Book ◽  
I. P. Jones ◽  
...  

Author(s):  
P. Trebbia ◽  
P. Ballongue ◽  
C. Colliex

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.


Author(s):  
C. Colliex ◽  
P. Trebbia

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.


Author(s):  
R. F. Egerton

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.


Author(s):  
R.D. Leapman ◽  
C.R. Swyt

The intensity of a characteristic electron energy loss spectroscopy (EELS) image does not, in general, directly reflect the elemental concentration. In fact, the raw core loss image can give a misleading impression of the elemental distribution. This is because the measured core edge signal depends on the amount of plural scattering which can vary significantly from region to region in a sample. Here, we show how the method for quantifying spectra due to Egerton et al. can be extended to maps.


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