Ordered structure in dilute solutions of highly charged polymer lattices as studied by microscopy. I. Interparticle distance as a function of latex concentration

1983 ◽  
Vol 78 (1) ◽  
pp. 536-540 ◽  
Author(s):  
N. Ise ◽  
T. Okubo ◽  
M. Sugimura ◽  
K. Ito ◽  
H. J. Nolte
Keyword(s):  
Interparticle Distance ◽  
Ordered Structure ◽  
Dilute Solutions ◽  
Charged Polymer

Ordered structure in dilute solutions of ionic biopolymers. 2. Small-angle x-ray scattering study of sodium polyacrylate solution

1980 ◽  
Vol 102 (27) ◽  
pp. 7901-7906 ◽  
Author(s):  
Norio Ise ◽  
Tsuneo Okubo ◽  
Kazuyuki Yamamoto ◽  
Hiromichi Kawai ◽  
Takeji Hashimoto ◽  
...  
Keyword(s):  
Small Angle ◽  
Sodium Polyacrylate ◽  
Ordered Structure ◽  
Dilute Solutions ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

‘‘Ordered’’ structure in dilute solutions of sodium polystyrenesulfonates as studied by small‐angle x‐ray scattering

1984 ◽  
Vol 81 (7) ◽  
pp. 3294-3306 ◽  
Author(s):  
Norio Ise ◽  
Tsuneo Okubo ◽  
Shigeru Kunugi ◽  
Hideki Matsuoka ◽  
K. Yamamoto ◽  
...  
Keyword(s):  
Small Angle ◽  
Ordered Structure ◽  
Dilute Solutions ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

‘‘Ordered’’ structure in dilute solutions of biopolymers as studied by small‐angle x‐ray scattering

1985 ◽  
Vol 83 (1) ◽  
pp. 378-387 ◽  
Author(s):  
Hideki Matsuoka ◽  
Norio Ise ◽  
Tsuneo Okubo ◽  
Shigeru Kunugi ◽  
Hiroshi Tomiyama ◽  
...  
Keyword(s):  
Small Angle ◽  
Ordered Structure ◽  
Dilute Solutions ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

“Ordered” structure in ionic dilute solutions: Dendrimers with univalent and bivalent counterions

2001 ◽  
Vol 64 (5) ◽  
Author(s):  
Atsuyuki Ohshima ◽  
Toshiki Konishi ◽  
Junpei Yamanaka ◽  
Norio Ise
Keyword(s):  
Ordered Structure ◽  
Dilute Solutions

Ordered structure in dilute solutions of poly‐L‐lysine as studied by small‐angle x‐ray scattering

1983 ◽  
Vol 78 (1) ◽  
pp. 541-545 ◽  
Author(s):  
N. Ise ◽  
T. Okubo ◽  
K. Yamamoto ◽  
H. Matsuoka ◽  
H. Kawai ◽  
...  
Keyword(s):  
Small Angle ◽  
Ordered Structure ◽  
Dilute Solutions ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Planar defects in ordered (Ga,In)P

1988 ◽  
Vol 46 ◽  
pp. 902-903
Author(s):  
S. McKernan ◽  
C. B. Carter ◽  
D. Bour ◽  
J. R. Shealy
Keyword(s):  
Electron Diffraction ◽  
Vapor Phase ◽  
Growth Direction ◽  
High Density ◽  
Ordered Structure ◽  
Planar Defects ◽  
Diffraction Patterns ◽  
Ternary Semiconductors ◽  
Anion Species ◽  
Metallic Vapor

The growth of ternary III-V semiconductors by organo-metallic vapor phase epitaxy (OMVPE) is widely practiced. It has been generally assumed that the resulting structure is the same as that of the corresponding binary semiconductors, but with the two different cation or anion species randomly distributed on their appropriate sublattice sites. Recently several different ternary semiconductors including AlxGa1-xAs, Gaxln-1-xAs and Gaxln1-xP1-6 have been observed in ordered states. A common feature of these ordered compounds is that they contain a relatively high density of defects. This is evident in electron diffraction patterns from these materials where streaks, which are typically parallel to the growth direction, are associated with the extra reflections arising from the ordering. However, where the (Ga,ln)P epilayer is reasonably well ordered the streaking is extremely faint, and the intensity of the ordered spot at 1/2(111) is much greater than that at 1/2(111). In these cases it is possible to image relatively clearly many of the defects found in the ordered structure.

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