Surface segregation of a Pt–Au alloy: An atom‐probe field ion microscope investigation

1980 ◽  
Vol 73 (3) ◽  
pp. 1464-1468 ◽  
Author(s):  
T. T. Tsong ◽  
Yee S. Ng ◽  
S. B. McLane
Keyword(s):  
Surface Segregation ◽  
Atom Probe ◽  
Probe Field ◽  
Microscope Investigation ◽  
Field Ion Microscope

The Atom-Probe Field Ion Microscope: Applications in Surface M Science

1998 ◽  
Vol 4 (S2) ◽  
pp. 110-111
Author(s):  
G. L. Kellogg
Keyword(s):  
Surface Science ◽  
Surface Segregation ◽  
Surface Region ◽  
Atom Probe ◽  
Single Atom ◽  
Solid Solution Alloy ◽  
Probe Field ◽  
Near Surface ◽  
Definition Of ◽  
Field Ion Microscope

The ability to locate an individual atom on a surface, remove it in a controlled fashion, and determine its chemical identity makes the atom-probe field-ion microscope an extremely powerful tool for the analysis of solid surfaces. By itself, the field ion microscope has contributed significantly to our understanding of surface atomic structure, single-atom surface diffusion, and the detailed interactions that occur between atoms and defects on surfaces.1 When used in combination with the atom-probe mass spectrometer there have been several additional areas within the traditional definition of "surface science" where the chemical identification capability of the atom probe has led to new insights. In this paper these applications are reviewed focusing on two specific areas: surface segregation in intermetallic alloys and chemical reactions on metal surfaces.The equilibrium distribution of component species in the near surface region of solid solution alloy may be different from the distribution in the bulk.

Fabrication and characterization - by High Resolution Electron Microscopy and atom probe microanalysis - of Co-based metallic multilayer films

1990 ◽  
Vol 48 (4) ◽  
pp. 772-773
Author(s):  
Amanda K. Petford-Long ◽  
A. Cerezo ◽  
M.G. Hetherington
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
High Resolution Electron Microscopy ◽  
Atom Probe ◽  
Multilayer Films ◽  
Interface Roughness ◽  
Probe Field ◽  
Resolution Electron ◽  
Potential Applications ◽  
Field Ion Microscope

The fabrication of multilayer films (MLF) with layer thicknesses down to one monolayer has led to the development of materials with unique properties not found in bulk materials. The properties of interest depend critically on the structure and composition of the films, with the interfacial regions between the layers being of particular importance. There are a number of magnetic MLF systems based on Co, several of which have potential applications as perpendicular magnetic (e.g Co/Cr) or magneto-optic (e.g. Co/Pt) recording media. Of particular concern are the effects of parameters such as crystallographic texture and interface roughness, which are determined by the fabrication conditions, on magnetic properties and structure.In this study we have fabricated Co-based MLF by UHV thermal evaporation in the prechamber of an atom probe field-ion microscope (AP). The multilayers were deposited simultaneously onto cobalt field-ion specimens (for AP and position-sensitive atom probe (POSAP) microanalysis without exposure to atmosphere) and onto the flat (001) surface of oxidised silicon wafers (for subsequent study in cross-section using high-resolution electron microscopy (HREM) in a JEOL 4000EX. Deposi-tion was from W filaments loaded with material in the form of wire (Co, Fe, Ni, Pt and Au) or flakes (Cr). The base pressure in the chamber was around 8×10−8 torr during deposition with a typical deposition rate of 0.05 - 0.2nm/s.

scholarly journals Atomic Level Characterization of the Morphology of Phases in Chromindur Magnetic Alloys

1991 ◽  
Vol 232 ◽  
Author(s):  
M. K Miller ◽  
P. P. Camus ◽  
M. G. Hetherington
Keyword(s):  
Atom Probe ◽  
Heat Treatments ◽  
Miscibility Gap ◽  
Probe Field ◽  
Magnet Alloy ◽  
Two Phases ◽  
Isothermal Heat Treatments ◽  
Field Ion Microscope ◽  
Permanent Magnet Alloy

ABSTRACTThe atom probe field ion microscope has been used to characterize the morphology and determine the compositions of the iron-rich a and chromium-enriched α′ phases produced during isothermal and step cooled heat treatments in a Chromindur II ductile permanent magnet alloy. The good magnetic properties of this material are due to a combination of the composition of the two phases and the isolated nature and size of the ferromagnetic a phase. The morphology of the a phase is produced as a result of the shape of the miscibility gap and the step-cooled heat treatment and is distinctly different from that formed during isothermal heat treatments.

Atom probe field ion microscope studies of palladium silicide on silicon

1995 ◽  
Vol 87-88 ◽  
pp. 279-283
Author(s):  
R.A. King ◽  
R.A.D. Mackenzie ◽  
G.D.W. Smith ◽  
N.A. Cade
Keyword(s):  
Atom Probe ◽  
Probe Field ◽  
Palladium Silicide ◽  
Field Ion Microscope
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