Negative ions from phosphorus halides due to cesium charge exchange

1976 ◽  
Vol 65 (2) ◽  
pp. 565-569 ◽  
Author(s):  
B. P. Mathur ◽  
Erhard W. Rothe ◽  
S. Y. Tang ◽  
Gene P. Reck
Keyword(s):  
Charge Exchange ◽  
Negative Ions ◽  
Phosphorus Halides

Production of negative ions by double charge exchange and their acceleration

1987 ◽  
Author(s):  
N. N. Semashko ◽  
V. V. Kuznetsov ◽  
A. I. Krylov ◽  
P. S. Firsov
Keyword(s):  
Charge Exchange ◽  
Negative Ions ◽  
Double Charge Exchange ◽  
Double Charge

Resonant Charge Exchange of the Negative Ions in Slow Collisions with Atoms

1969 ◽  
Vol 186 (1) ◽  
pp. 89-95 ◽  
Author(s):  
D. M. Davidović ◽  
R. K. Janev
Keyword(s):  
Charge Exchange ◽  
Negative Ions ◽  
Resonant Charge Exchange

scholarly journals Detection of Negative Ions Produced by Charge Exchange on Oxide Surfaces

2016 ◽  
Vol 59 (4) ◽  
pp. 83-86 ◽  
Author(s):  
Kyohei TASHIRO ◽  
Masako SHINDO ◽  
Shingo ISHIWATA ◽  
Ken-ichi SHUDO
Keyword(s):  
Charge Exchange ◽  
Negative Ions ◽  
Oxide Surfaces

First H+ Charge-Exchange Images in the Stim.

1976 ◽  
Vol 34 ◽  
pp. 504-505
Author(s):  
Wm. H. Escovitz ◽  
T. R. Fox ◽  
R. Levi-Setti
Keyword(s):  
Charge Exchange ◽  
Neutral Component ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Neutral Particles ◽  
Charged Beam ◽  
Scanning Transmission ◽  
Contrast Mechanism ◽  
Ion Microscopy ◽  
Beam Component

Charge exchange, the neutralization of ions by electron capture as the ions traverse matter, is a well-known phenomenon of atomic physics which is relevant to ion microscopy. In conventional transmission ion microscopes, the neutral component of the beam after it emerges from the specimen cannot be focused. The scanning transmission ion microscope (STIM) enables the detection of this signal to make images. Experiments with a low-resolution 55 kV STIM indicate that the charge-exchange signal provides a new contrast mechanism to detect extremely small amounts of matter. In an early version of charge-exchange detection (fig. 1), a permanent magnet installed between the specimen and the detector (a channel electron multiplier) sweeps the charged beam component away from the detector and allows only the neutrals to reach it. When the magnet is removed, both charged and neutral particles reach the detector.

Sign in / Sign up

Export Citation Format

Share Document