Parametric conversion and index of refraction measurements in hydrothermally-grown KTiOPO4

1989 ◽  
Author(s):  
Herman Vanherzeele ◽  
J. D. Bierlein ◽  
F. C. Zumsteg
Keyword(s):  
Index Of Refraction ◽  
Parametric Conversion

Interferometric (Fourier-Spectroscopic) Measurement of Electron Energy Distributions

1990 ◽  
Vol 48 (2) ◽  
pp. 110-111 ◽  
Author(s):  
F. Hasselbach ◽  
A. Schäfer
Keyword(s):  
Group Velocity ◽  
Wave Packets ◽  
Index Of Refraction ◽  
Electron Wave ◽  
Fringe Contrast ◽  
Faraday Cage ◽  
Optical Index ◽  
Wien Filter ◽  
Coherent Wave ◽  
Electric And Magnetic Fields

Möllenstedt and Wohland proposed in 1980 two methods for measuring the coherence lengths of electron wave packets interferometrically by observing interference fringe contrast in dependence on the longitudinal shift of the wave packets. In both cases an electron beam is split by an electron optical biprism into two coherent wave packets, and subsequently both packets travel part of their way to the interference plane in regions of different electric potential, either in a Faraday cage (Fig. 1a) or in a Wien filter (crossed electric and magnetic fields, Fig. 1b). In the Faraday cage the phase and group velocity of the upper beam (Fig.1a) is retarded or accelerated according to the cage potential. In the Wien filter the group velocity of both beams varies with its excitation while the phase velocity remains unchanged. The phase of the electron wave is not affected at all in the compensated state of the Wien filter since the electron optical index of refraction in this state equals 1 inside and outside of the Wien filter.

TEM characterization of proton-exchanged LiNbO3 optical waveguides

1986 ◽  
Vol 44 ◽  
pp. 480-481
Author(s):  
W. E. Lee
Keyword(s):  
Refractive Index ◽  
Benzoic Acid ◽  
Optical Waveguides ◽  
Total Internal Reflection ◽  
Index Of Refraction ◽  
Optical Measurements ◽  
Lithium Ions ◽  
Wide Channel ◽  
Tem Characterization

An optical waveguide consists of a several-micron wide channel with a slightly different index of refraction than the host substrate; light can be trapped in the channel by total internal reflection.Optical waveguides can be formed from single-crystal LiNbO3 using the proton exhange technique. In this technique, polished specimens are masked with polycrystal1ine chromium in such a way as to leave 3-13 μm wide channels. These are held in benzoic acid at 249°C for 5 minutes allowing protons to exchange for lithium ions within the channels causing an increase in the refractive index of the channel and creating the waveguide. Unfortunately, optical measurements often reveal a loss in waveguiding ability up to several weeks after exchange.

Microspectroscopy Using a Solid Immersion Lens

2001 ◽  
Vol 7 (S2) ◽  
pp. 148-149
Author(s):  
C.D. Poweleit ◽  
J Menéndez
Keyword(s):  
Spatial Resolution ◽  
Focal Plane ◽  
Numerical Aperture ◽  
Normal Incidence ◽  
Spot Size ◽  
Index Of Refraction ◽  
Objective Lens ◽  
Improvement Factor ◽  
Oil Immersion ◽  
Long Time

Oil immersion lenses have been used in optical microscopy for a long time. The light’s wavelength is decreased by the oil’s index of refraction n and this reduces the minimum spot size. Additionally, the oil medium allows a larger collection angle, thereby increasing the numerical aperture. The SIL is based on the same principle, but offers more flexibility because the higher index material is solid. in particular, SILs can be deployed in cryogenic environments. Using a hemispherical glass the spatial resolution is improved by a factor n with respect to the resolution obtained with the microscope’s objective lens alone. The improvement factor is equal to n2 for truncated spheres.As shown in Fig. 1, the hemisphere SIL is in contact with the sample and does not affect the position of the focal plane. The focused rays from the objective strike the lens at normal incidence, so that no refraction takes place.

Optical properties of a thin layer of the Vanadium dioxide at the metal state

2015 ◽  
Vol 9 (1) ◽  
pp. 2303-2310
Author(s):  
Abderrahim Benchaib ◽  
Abdesselam Mdaa ◽  
Izeddine Zorkani ◽  
Anouar Jorio
Keyword(s):  
Optical Properties ◽  
Thin Layer ◽  
Vanadium Dioxide ◽  
Ultra Violet ◽  
Index Of Refraction ◽  
Cost Of Energy ◽  
Infra Red ◽  
Metal State ◽  
The Cost ◽  
Reversible Phase

The vanadium dioxide VO₂ currently became very motivating for the nanotechnologies’ researchers. It makes party of the intelligent materials because these optical properties abruptly change semiconductor state with metal at a critical  temperature θ = 68°C. This transition from reversible phase is carried out from a monoclinical structure characterizing its semiconductor state at low temperature towards the metal state of this material which becomes tétragonal rutile for  θ ˃ 68°C ; it is done during a few nanoseconds. Several studies were made on this material in a massive state and a thin layer. We will simulate by Maple the constant optics of a thin layer of VO₂ thickness z = 82 nm for the metal state according to the energy ω of the incidental photons in the energy interval: 0.001242 ≤ ω(ev) ≤ 6, from the infra-red (I.R) to the ultra-violet (U.V) so as to be able to control the various technological nano applications, like the detectors I.R or the U.V,  the intelligent windows to  increase  the energy efficiency in the buildings in order to save the cost of energy consumption by electric air-conditioning and the paintings containing nano crystals of this material. The constant optics, which we will simulate, is: the index of refraction, the reflectivity, the transmittivity, the coefficient of extinction, the dielectric functions ԑ₁ real part and  ԑ₂  imaginary part of the permittivity complexes ԑ of this material and the coefficient absorption. 

Optical properties of the Vanadium dioxide

2015 ◽  
Vol 8 (2) ◽  
pp. 2148-2155 ◽  
Author(s):  
Abderrahim Benchaib ◽  
Abdesselam Mdaa ◽  
Izeddine Zorkani ◽  
Anouar Jorio
Keyword(s):  
Energy Efficiency ◽  
Optical Properties ◽  
Critical Temperature ◽  
Thin Layer ◽  
Dielectric Function ◽  
Vanadium Dioxide ◽  
Ultra Violet ◽  
Index Of Refraction ◽  
Practical Utility ◽  
Infra Red

The vanadium dioxide is a material thermo chromium which sees its optical properties changing at the time of the transition from the phase of semiconductor state ↔ metal, at a critical temperature of 68°C. The study of the optical properties of a thin layer of VO₂ thickness 82 nm, such as the dielectric function, the index of refraction, the coefficient ofextinction, the absorption’s coefficient, the reflectivity, the transmittivity, in the photonic spectrum of energy ω located inthe interval: 0.001242 ≤ ω (ev) ≤ 6, enables us to control well its practical utility in various applications, like the intelligentpanes, the photovoltaic, paintings for increasing energy efficiency in buildings, detectors of infra-red (I.R) or ultra-violet(U.V). We will make simulations with Maple and compare our results with those of the literature

Combining First-Principles and Data Modeling for the Accurate Prediction of the Refractive Index of Organic Polymers

2017 ◽  
Author(s):  
Mohammad Atif Faiz Afzal ◽  
Chong Cheng ◽  
Johannes Hachmann
Keyword(s):  
First Principles ◽  
Data Modeling ◽  
Accurate Prediction ◽  
Index Of Refraction ◽  
Structure Theory ◽  
Organic Polymers ◽  
Number Density ◽  
Lorenz Equation ◽  
In Silico Studies ◽  
Wide Range

Organic materials with a high index of refraction (RI) are attracting considerable interest due to their potential application in optic and optoelectronic devices. However, most of these applications require an RI value of 1.7 or larger, while typical carbon-based polymers only exhibit values in the range of 1.3–1.5. This paper introduces an efficient computational protocol for the accurate prediction of RI values in polymers to facilitate in silico studies that an guide the discovery and design of next-generation high-RI materials. Our protocol is based on the Lorentz-Lorenz equation and is parametrized by the polarizability and number density values of a given candidate compound. In the proposed scheme, we compute the former using first-principles electronic structure theory and the latter using an approximation based on van der Waals volumes. The critical parameter in the number density approximation is the packing fraction of the bulk polymer, for which we have devised a machine learning model. We demonstrate the performance of the proposed RI protocol by testing its predictions against the experimentally known RI values of 112 optical polymers. Our approach to combine first-principles and data modeling emerges as both a successful and highly economical path to determining the RI values for a wide range of organic polymers.

Silicon Fringe Sample Metrology—A Thickness Measurement Technique

2013 ◽  
Author(s):  
Mark Kimball
Keyword(s):  
Temperature Dependence ◽  
Temperature Coefficient ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Sample Thickness ◽  
Index Of Refraction ◽  
Interference Fringes ◽  
Noncontact Method ◽  
Thickness Variations

Abstract Silicon’s index of refraction has a strong temperature coefficient. This temperature dependence can be used to aid sample thinning procedures used for backside analysis, by providing a noncontact method of measuring absolute sample thickness. It also can remove slope ambiguity while counting interference fringes (used to determine the direction and magnitude of thickness variations across a sample).

Evidence of parametric conversion in the frequencies of acoustic domains in CdS

1969 ◽  
Vol 5 (21) ◽  
pp. 529 ◽  
Author(s):  
G.I. Robertson ◽  
M.B.N. Butler
Keyword(s):  
Parametric Conversion
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