Scanning near-field cathodoluminescence microscopy for semiconductor investigations: A theoretical study

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Vol 86 (8) ◽  
pp. 4326-4332 ◽  
Author(s):  
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M. Troyon
Keyword(s):  
2011 ◽  
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Vol 61 (1-4) ◽  
pp. 51-55 ◽  
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