Defect generation under substrate-hot-electron injection into ultrathin silicon dioxide layers
Keyword(s):
1997 ◽
Vol 44
(2)
◽
pp. 288-296
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Keyword(s):
1995 ◽
Vol 187
◽
pp. 186-189
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1997 ◽
Vol 80
(8)
◽
pp. 11-19
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Keyword(s):
1980 ◽
Vol 127
(1)
◽
pp. 191-194
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Keyword(s):
2020 ◽
Vol 131
(3)
◽
pp. 456-459
Keyword(s):
1988 ◽
Vol 27
(Part 2, No. 12)
◽
pp. L2395-L2397
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Keyword(s):
2008 ◽
Vol 52
(6)
◽
pp. 844-848
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Keyword(s):