Magnetic domain pinning in patterned magneto-optical material

1999 ◽  
Vol 85 (8) ◽  
pp. 5980-5982 ◽  
Author(s):  
Te-Ho Wu ◽  
J. C. Wu ◽  
Y. W. Huang ◽  
Bing-Mau Chen ◽  
Han-Ping D. Schieh
Keyword(s):  
Magnetic Domain ◽  
Optical Material ◽  
Domain Pinning

scholarly journals Distribution of magnetic domain pinning fields inGa1−xMnxAsferromagnetic films

2008 ◽  
Vol 78 (7) ◽  
Author(s):  
Jungtaek Kim ◽  
D. Y. Shin ◽  
Sanghoon Lee ◽  
X. Liu ◽  
J. K. Furdyna
Keyword(s):  
Magnetic Domain ◽  
Domain Pinning

Thickness dependence of magnetic domain pinning energy in GaMnAs ferromagnetic semiconductor films

2008 ◽  
Vol 103 (7) ◽  
pp. 07D118 ◽  
Author(s):  
Sun-Young Yea ◽  
Sun-Jae Chung ◽  
Hyunji Son ◽  
Sanghoon Lee ◽  
X. Liu ◽  
...  
Keyword(s):  
Magnetic Domain ◽  
Ferromagnetic Semiconductor ◽  
Thickness Dependence ◽  
Semiconductor Films ◽  
Pinning Energy ◽  
Domain Pinning

Magnetic domain pinning in an anisotropy-engineered GdTbFe thin film

2006 ◽  
Vol 100 (3) ◽  
pp. 033904 ◽  
Author(s):  
Stan Konings ◽  
Jorge Miguel ◽  
Jeroen Goedkoop ◽  
Julio Camarero ◽  
Jan Vogel
Keyword(s):  
Thin Film ◽  
Magnetic Domain ◽  
Domain Pinning

Magnetic Domain Pinning in Lithographically Patterned Amorphous Magnetic Layer

1999 ◽  
Vol 38 (Part 1, No. 3B) ◽  
pp. 1832-1834 ◽  
Author(s):  
Jong-Ching Wu ◽  
Ying-Wen Huang ◽  
Bing-Mau Chen ◽  
Te-ho Wu ◽  
Han-PingD. Shieh
Keyword(s):  
Magnetic Layer ◽  
Magnetic Domain ◽  
Domain Pinning

scholarly journals MAGNETIC DOMAIN PINNING IN PATTERNED DyFeCo FOR THE APPLICATION OF MAGNETO-OPTICAL RECORDING

1998 ◽  
Vol 22 (S_2_MORIS_97) ◽  
pp. S2_145-148 ◽  
Author(s):  
Te-ho Wu ◽  
J.C. Wu ◽  
Bing-Mau Chen ◽  
Han-Ping D. Shieh
Keyword(s):  
Magnetic Domain ◽  
Optical Recording ◽  
Domain Pinning

The direct determination of magnetic domain wall profiles using a split detector STEM

1978 ◽  
Vol 36 (1) ◽  
pp. 466-467
Author(s):  
J.N. Chapman ◽  
P.E. Batson ◽  
E.M. Waddell ◽  
R.P. Ferrier
Keyword(s):  
Electron Microscope ◽  
Domain Wall ◽  
Transmission Electron Microscope ◽  
Domain Walls ◽  
Photographic Plate ◽  
Magnetic Domain ◽  
Direct Determination ◽  
Quantitative Information ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.

Lorentz microscopy study of magnetic domain walls in Fe-Cr-Co alloys

1978 ◽  
Vol 36 (1) ◽  
pp. 462-463
Author(s):  
Yalcin Belli
Keyword(s):  
Domain Walls ◽  
Magnetic Domain ◽  
Microscopy Study ◽  
Ferromagnetic Phase ◽  
Stable Phase ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
Magnetic Hardening ◽  
Electron Microscopes ◽  
Co Alloys

Fe-Cr-Co alloys have great technological potential to replace Alnico alloys as hard magnets. The relationship between the microstructures and the magnetic properties has been recently established for some of these alloys. The magnetic hardening has been attributed to the decomposition of the high temperature stable phase (α) into an elongated Fe-rich ferromagnetic phase (α1) and a weakly magnetic or non-magnetic Cr-rich phase (α2). The relationships between magnetic domains and domain walls and these different phases are yet to be understood. The TEM has been used to ascertain the mechanism of magnetic hardening for the first time in these alloys. The present paper describes the magnetic domain structure and the magnetization reversal processes in some of these multiphase materials. Microstructures to change properties resulting from, (i) isothermal aging, (ii) thermomagnetic treatment (TMT) and (iii) TMT + stepaging have been chosen for this investigation. The Jem-7A and Philips EM-301 transmission electron microscopes operating at 100 kV have been used for the Lorentz microscopy study of the magnetic domains and their interactions with the finely dispersed precipitate phases.

Magnetic Material Observation Assembly for Tem with a Eucentric Goniometer

1976 ◽  
Vol 34 ◽  
pp. 540-541
Author(s):  
K. Shi rota ◽  
A. Yonezawa ◽  
K. Shibatomi ◽  
T. Yanaka
Keyword(s):  
Magnetic Material ◽  
Electron Microscope ◽  
Magnetic Domain ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Correction Of Astigmatism ◽  
Single Orientation ◽  
Conventional Transmission Electron Microscope

As is well known, it is not so easy to operate a conventional transmission electron microscope for observation of magnetic materials. The reason is that the instrument requires re-alignment of the axis and re-correction of astigmatism after each specimen shift, as the lens field is greatly disturbed by the specimen. With a conventional electron microscope, furthermore, it is impossible to observe magnetic domains, because the specimen is magnetized to single orientation by the lens field. The above mentioned facts are due to the specimen usually being in the lens field. Thus, special techniques or systems are usually required for magnetic material observation (especially magnetic domain observation), for example, the technique to switch off the objective lens current and Lorentz microscopy. But these cannot give high image quality and wide magnification range, and furthermore Lorentz microscopy is very complicated.

Temperature Dependence of Magnetic Domains and Wall Structures

1972 ◽  
Vol 30 ◽  
pp. 496-497
Author(s):  
Sonoko Tsukahara ◽  
Tadami Taoka ◽  
Hisao Nishizawa
Keyword(s):  
Temperature Dependence ◽  
Domain Walls ◽  
Magnetic Domain ◽  
Iron Film ◽  
Objective Lens ◽  
Lorentz Microscopy ◽  
Domain Structures ◽  
Wall Structures ◽  
Crystal Films ◽  
Metallurgical Structure

The high voltage Lorentz microscopy was successfully used to observe changes with temperature; of domain structures and metallurgical structures in an iron film set on the hot stage combined with a goniometer. The microscope used was the JEM-1000 EM which was operated with the objective lens current cut off to eliminate the magnetic field in the specimen position. Single crystal films with an (001) plane were prepared by the epitaxial growth of evaporated iron on a cleaved (001) plane of a rocksalt substrate. They had a uniform thickness from 1000 to 7000 Å.The figure shows the temperature dependence of magnetic domain structure with its corresponding deflection pattern and metallurgical structure observed in a 4500 Å iron film. In general, with increase of temperature, the straight domain walls decrease in their width (at 400°C), curve in an iregular shape (600°C) and then vanish (790°C). The ripple structures with cross-tie walls are observed below the Curie temperature.

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