The improved polarization retention through high-field charge injection in highly strained BiFeO3 thin films with preferred domain orientations

2012 ◽  
Vol 100 (13) ◽  
pp. 132901 ◽  
Author(s):  
X. B. Liu ◽  
N. F. Ding ◽  
A. Q. Jiang ◽  
P. X. Yang
Keyword(s):  
Thin Films ◽  
High Field ◽  
Charge Injection ◽  
Bifeo3 Thin Films ◽  
Highly Strained ◽  
Polarization Retention

scholarly journals Electromechanical Responses: Nanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO3 Thin Films (Adv. Mater. 28/2011)

2011 ◽  
Vol 23 (28) ◽  
pp. 3107-3107 ◽  
Author(s):  
Anoop R. Damodaran ◽  
Chen-Wei Liang ◽  
Qing He ◽  
Chun-Yen Peng ◽  
Li Chang ◽  
...  
Keyword(s):  
Thin Films ◽  
Bifeo3 Thin Films ◽  
Electromechanical Responses ◽  
Nanoscale Structure ◽  
Highly Strained

scholarly journals Stabilization of mixed-phase structures in highly strained BiFeO3 thin films via chemical-alloying

2012 ◽  
Vol 100 (8) ◽  
pp. 082904 ◽  
Author(s):  
Anoop R. Damodaran ◽  
Eric Breckenfeld ◽  
Amber K. Choquette ◽  
Lane W. Martin
Keyword(s):  
Thin Films ◽  
Mixed Phase ◽  
Phase Structures ◽  
Bifeo3 Thin Films ◽  
Highly Strained

scholarly journals Nanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO3 Thin Films

2011 ◽  
Vol 23 (28) ◽  
pp. 3170-3175 ◽  
Author(s):  
Anoop R. Damodaran ◽  
Chen-Wei Liang ◽  
Qing He ◽  
Chun-Yen Peng ◽  
Li Chang ◽  
...  
Keyword(s):  
Thin Films ◽  
Bifeo3 Thin Films ◽  
Nanoscale Structure ◽  
Highly Strained

scholarly journals Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO3 thin films

APL Materials ◽  
2016 ◽  
Vol 4 (3) ◽  
pp. 036106 ◽  
Author(s):  
Yongsoo Yang ◽  
Christianne Beekman ◽  
Wolter Siemons ◽  
Christian M. Schlepütz ◽  
Nancy Senabulya ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Structural Phase Transition ◽  
Structural Phase ◽  
Thickness Dependence ◽  
Transition Temperatures ◽  
Bifeo3 Thin Films ◽  
Phase Transition Temperatures ◽  
Highly Strained

Characterization and Manipulation of Mixed Phase Nanodomains in Highly Strained BiFeO3 Thin Films

ACS Nano ◽  
2012 ◽  
Vol 6 (6) ◽  
pp. 5388-5394 ◽  
Author(s):  
Lu You ◽  
Zuhuang Chen ◽  
Xi Zou ◽  
Hui Ding ◽  
Weigang Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Mixed Phase ◽  
Bifeo3 Thin Films ◽  
Highly Strained

Atomic Visualization of the Phase Transition in Highly Strained BiFeO3 Thin Films with Excellent Pyroelectric Response

Nano Energy ◽  
2015 ◽  
Vol 17 ◽  
pp. 72-81 ◽  
Author(s):  
Chung-Hua Chiu ◽  
Wen-I Liang ◽  
Chun-Wei Huang ◽  
Jui-Yuan Chen ◽  
Yun-Ya Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Bifeo3 Thin Films ◽  
Highly Strained ◽  
Pyroelectric Response

scholarly journals Electrically driven transient and permanent phase transformations in highly strained epitaxial BiFeO3 thin films

APL Materials ◽  
2020 ◽  
Vol 8 (10) ◽  
pp. 101110
Author(s):  
Hyeon Jun Lee ◽  
Jeongyong Kim ◽  
Seung Hyun Hwang ◽  
Hyeokmin Choe ◽  
Semen Gorfman ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transformations ◽  
Bifeo3 Thin Films ◽  
Highly Strained

Directed assembly of nano-scale phase variants in highly strained BiFeO3 thin films

2012 ◽  
Vol 112 (6) ◽  
pp. 064102 ◽  
Author(s):  
Jian Zhou ◽  
Morgan Trassin ◽  
Qing He ◽  
Nobumichi Tamura ◽  
Martin Kunz ◽  
...  
Keyword(s):  
Thin Films ◽  
Directed Assembly ◽  
Nano Scale ◽  
Bifeo3 Thin Films ◽  
Highly Strained ◽  
Phase Variants

Charge Trapping and Degradation Properties of PZT Thin Films for MEMS

1996 ◽  
Vol 444 ◽  
Author(s):  
Hyeon-Seag Kim ◽  
D. L. Polla ◽  
S. A. Campbell
Keyword(s):  
Thin Films ◽  
Loss Factor ◽  
High Field ◽  
Microelectromechanical Systems ◽  
Charge Trapping ◽  
Metal Organic ◽  
Electrical Reliability ◽  
Silicon Based ◽  
Degradation Properties ◽  
Organic Decomposition

AbstractThe electrical reliability properties of PZT (54/46) thin films have been measured for the purpose of integrating this material with silicon-based microelectromechanical systems. Ferroelectric thin films of PZT were prepared by metal organic decomposition. The charge trapping and degradation properties of these thin films were studied through device characteristics such as hysteresis loop, leakage current, fatigue, dielectric constant, capacitancevoltage, and loss factor measurements. Several unique experimental results have been found. Different degradation processes were verified through fatigue (bipolar stress), low and high charge injection (unipolar stress), and high field stressing (unipolar stress).

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