Electronic properties of tetrahedral amorphous carbon investigated by scanning tunneling microscopy

1999 ◽  
Vol 85 (3) ◽  
pp. 1609-1615 ◽  
Author(s):  
C. Arena ◽  
B. Kleinsorge ◽  
J. Robertson ◽  
W. I. Milne ◽  
M. E. Welland
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Electronic Properties ◽  
Amorphous Carbon ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Tetrahedral Amorphous Carbon

Scanning Tunneling Microscopy of Amorphous Carbon Films

1990 ◽  
Vol 48 (1) ◽  
pp. 318-319
Author(s):  
Mircea Fotino ◽  
D.C. Parks
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Amorphous Carbon ◽  
Carbon Films ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Amorphous Carbon Films ◽  
Image Optimization ◽  
Step Procedure ◽  
Stm Images

In the last few years scanning tunneling microscopy (STM) has made it possible and easily accessible to visualize surfaces of conducting specimens at the atomic scale. Such performance allows the detailed characterization of surface morphology in an increasing spectrum of applications in a wide variety of fields. Because the basic imaging process in STM differs fundamentally from its equivalent in other well-established microscopies, good understanding of the imaging mechanism in STM enables one to grasp the correct information content in STM images. It thus appears appropriate to explore by STM the structure of amorphous carbon films because they are used in many applications, in particular in the investigation of delicate biological specimens that may be altered through the preparation procedures.All STM images in the present study were obtained with the commercial instrument Nanoscope II (Digital Instruments, Inc., Santa Barbara, California). Since the importance of the scanning tip for image optimization and artifact reduction cannot be sufficiently emphasized, as stressed by early analyses of STM image formation, great attention has been directed toward adopting the most satisfactory tip geometry. The tips used here consisted either of mechanically sheared Pt/Ir wire (90:10, 0.010" diameter) or of etched W wire (0.030" diameter). The latter were eventually preferred after a two-step procedure for etching in NaOH was found to produce routinely tips with one or more short whiskers that are essentially rigid, uniform and sharp (Fig. 1) . Under these circumstances, atomic-resolution images of cleaved highly-ordered pyro-lytic graphite (HOPG) were reproducibly and readily attained as a standard criterion for easily recognizable and satisfactory performance (Fig. 2).

Scanning tunneling microscopy of films of amorphous carbon doped with copper

2000 ◽  
Vol 34 (2) ◽  
pp. 217-220 ◽  
Author(s):  
A. O. Golubok ◽  
O. M. Gorbenko ◽  
T. K. Zvonareva ◽  
S. A. Masalov ◽  
V. V. Rozanov ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Amorphous Carbon ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Carbon Doped

scholarly journals On-surface synthesis of singly and doubly porphyrin-capped graphene nanoribbon segments

2021 ◽  
Vol 12 (1) ◽  
pp. 247-252
Author(s):  
Luis M. Mateo ◽  
Qiang Sun ◽  
Kristjan Eimre ◽  
Carlo A. Pignedoli ◽  
Tomas Torres ◽  
...  
Keyword(s):  
High Resolution ◽  
Dft Calculations ◽  
Scanning Tunneling Microscopy ◽  
Electronic Properties ◽  
Graphene Nanoribbon ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Singly and doubly porphyrin-capped graphene nanoribbon segments are reported and their electronic properties are studied by high-resolution scanning tunneling microscopy and spectroscopy, and DFT calculations.

Identifying the electronic properties of the Ge(111)-(2×1) surface by low-temperature scanning tunneling microscopy

JETP Letters ◽  
2005 ◽  
Vol 82 (5) ◽  
pp. 279-283 ◽  
Author(s):  
P. I. Arseyev ◽  
N. S. Maslova ◽  
V. I. Panov ◽  
S. V. Savinov ◽  
C. Van Haesendonck
Keyword(s):  
Low Temperature ◽  
Scanning Tunneling Microscopy ◽  
Electronic Properties ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Temperature Scanning
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