Constant tip-surface distance with atomic force microscopy via quality factor feedback

2012 ◽  
Vol 83 (2) ◽  
pp. 023706 ◽  
Author(s):  
Lin Fan ◽  
Daniel Potter ◽  
Todd Sulchek
Keyword(s):  
Atomic Force Microscopy ◽  
Quality Factor ◽  
Force Microscopy ◽  
Surface Distance ◽  
Atomic Force

Optimizing the Quality Factor of Quartz Tuning Fork Force Sensor for Atomic Force Microscopy: Impact of Additional Mass and Mass Rebalance

2017 ◽  
Vol 17 (9) ◽  
pp. 2797-2806 ◽  
Author(s):  
Danish Hussain ◽  
Jianmin Song ◽  
Hao Zhang ◽  
Xianghe Meng ◽  
Wen Yongbing ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Quality Factor ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Additional Mass ◽  
Force Microscopy ◽  
Atomic Force

Force Feedback in Dynamic Atomic Force Microscopy

2005 ◽  
Author(s):  
R. W. Stark
Keyword(s):  
Atomic Force Microscopy ◽  
Quality Factor ◽  
Time Delays ◽  
Force Feedback ◽  
Feedback Signal ◽  
Detection Scheme ◽  
Force Microscopy ◽  
Atomic Force ◽  
Non Linear ◽  
Non Linear System

The feedback perspective of dynamic AFM provides a powerful tool to investigate the non-linear system dynamics from a system theoretic point of view. Including the higher order dynamics of the extended cantilever beam in the model the contact resonances can be reproduced faithfully without the need to solve the partial differential equation of motion directly. The investigation of the non-linear dynamics provides valuable insight into the generation of higher harmonics in dynamic AFM. However, the light lever detection scheme is widely used in dynamic AFM. This means that — strictly speaking — the tip-deflection is not a measurable quantity: the local deflection angle is measured but not the deflection itself. Additionally, time-delays may be introduced into the system influencing the dynamic behavior. Apart from system inherent time delays, a delayed force feedback is often used in order manipulate the system’s resonance characteristics (quality factor). Such an active control of the oscillatory behavior of the cantilever used in atomic force microscopy (AFM) allows one to tune the quality factor to purpose. For experiments requiring a high force sensitivity an enhancement of the quality factor is desirable whereas in time critical experiments additional damping may be needed. In order to control the quality factor a feedback signal is used that approximates the time derivative of the system state within the bandwidth of interest.

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