Molecular dynamics simulations of low-energy (25–200 eV) argon ion interactions with silicon surfaces: Sputter yields and product formation pathways
2008 ◽
Vol 26
(2)
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pp. 274-280
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2011 ◽
Vol 269
(14)
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pp. 1604-1608
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1993 ◽
Vol 1
(5)
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pp. 731-740
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Keyword(s):
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1992 ◽
Vol 67
(1-4)
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pp. 296-300
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2000 ◽
Vol 62
(15)
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pp. 10383-10393
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1989 ◽
Vol 60
(4)
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pp. 131-135
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