scholarly journals Direct observation of dynamic force propagation between focal adhesions of cells on microposts by atomic force microscopy

2011 ◽  
Vol 99 (26) ◽  
pp. 263703 ◽  
Author(s):  
Akinori Okada ◽  
Yusuke Mizutani ◽  
Agus Subagyo ◽  
Hirotaka Hosoi ◽  
Motonori Nakamura ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Focal Adhesions ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Propagation

DIRECT OBSERVATION BY ATOMIC FORCE MICROSCOPY OF SEVERAL BACTERIA SPECIES

1996 ◽  
Vol 86 (2-3) ◽  
pp. 193-193
Author(s):  
Denis ROBICHON ◽  
Jean-Franc¸ois CAVELLIER ◽  
Yves CENATIEMPO ◽  
Jean-Christophe GIRARD
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of polyhydroxyalkanoate chains by atomic force microscopy

2002 ◽  
Vol 91 (1-4) ◽  
pp. 157-164 ◽  
Author(s):  
Kumar Sudesh ◽  
Zhihua Gan ◽  
Ken’ichiro Matsumoto ◽  
Yoshiharu Doi
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Force Microscopy ◽  
Atomic Force

Direct observation of surfactant aggregate behavior on a mica surface using high-speed atomic force microscopy

2011 ◽  
Vol 47 (17) ◽  
pp. 4974 ◽  
Author(s):  
Shigeto Inoue ◽  
Takayuki Uchihashi ◽  
Daisuke Yamamoto ◽  
Toshio Ando
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Mica Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Aggregate Behavior

Atomic Force Microscopy

2021 ◽  
pp. 379-400
Author(s):  
C. Julian Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Entire Range ◽  
Tunneling Current ◽  
Vibrational Amplitude ◽  
Dynamic Mode ◽  
Dynamic Force ◽  
Force Detection ◽  
Static Mode ◽  
Force Microscopy ◽  
Atomic Force

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the static mode and the dynamic mode. The general design and the typical method of manufacturing of the cantilevers are discussed. Two popular methods of static force detection are presented. The popular dynamic-force detection method, the tapping mode is described, especially the methods in liquids. The non-contact AFM, which has achieved atomic resolution in the weak attractive force regime, is discussed in detail. An elementary and transparent analysis of the principles, including the frequency shift, the second harmonics, and the average tunneling current, is presented. It requires only Newton’s equation and Fourier analysis, and the final results are analyzed over the entire range of vibrational amplitude. The implementation is briefly discussed.

Direct observation of atomic step edges on the rutile TiO2(110)-(1 × 1) surface using atomic force microscopy

2018 ◽  
Vol 20 (44) ◽  
pp. 28331-28337 ◽  
Author(s):  
Huan Fei Wen ◽  
Masato Miyazaki ◽  
Quanzhen Zhang ◽  
Yuuki Adachi ◽  
Yan Jun Li ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Atomic Step ◽  
Atomic Configuration ◽  
Rutile Tio2 ◽  
Force Microscopy ◽  
Atomic Force ◽  
Step Edges

Clarifying the atomic configuration of step edges on a rutile TiO2 surface is crucial for understanding its fundamental reactivity, and the direct observation of atomic step edges is still a challenge.

Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

2006 ◽  
Vol 100 (7) ◽  
pp. 074315 ◽  
Author(s):  
Osamu Takeuchi ◽  
Takaaki Miyakoshi ◽  
Atsushi Taninaka ◽  
Katsunori Tanaka ◽  
Daichi Cho ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Control ◽  
Force Spectroscopy ◽  
Dynamic Force ◽  
Atomic Force Microscopy Probe ◽  
Dynamic Force Spectroscopy ◽  
Force Microscopy ◽  
Spectroscopy Measurement ◽  
Atomic Force

scholarly journals Direct Observation of Rotary Catalysis of Rotorless F1-ATPase by High-Speed Atomic Force Microscopy

2012 ◽  
Vol 102 (3) ◽  
pp. 600a
Author(s):  
Ryota Iino ◽  
Takayuki Uchihashi ◽  
Toshio Ando ◽  
Hiroyuki Noji
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
High Speed ◽  
Force Microscopy ◽  
F1 Atpase ◽  
Atomic Force ◽  
Rotary Catalysis

Direct Observation at Nanoscale of Resistance Switching in NiO Layers by Conductive-Atomic Force Microscopy

2011 ◽  
Vol 4 (5) ◽  
pp. 051101 ◽  
Author(s):  
Damien Deleruyelle ◽  
Carine Dumas ◽  
Marion Carmona ◽  
Christophe Muller ◽  
Sabina Spiga ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Observation ◽  
Resistance Switching ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Different directional energy dissipation of heterogeneous polymers in bimodal atomic force microscopy

RSC Advances ◽  
2019 ◽  
Vol 9 (47) ◽  
pp. 27464-27474 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Dynamic Force ◽  
Force Detection ◽  
Force Microscopy ◽  
Nanomechanical Properties ◽  
Powerful Technique ◽  
Atomic Force ◽  
Nanoscale Imaging ◽  
Heterogeneous Polymers

Dynamic force microscopy (DFM) has become a multifunctional and powerful technique for the study of the micro–nanoscale imaging and force detection, especially in the compositional and nanomechanical properties of polymers.

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