Metal deposition into a porous silicon layer by immersion plating: Influence of halogen ions

1998 ◽  
Vol 83 (8) ◽  
pp. 4501-4506 ◽  
Author(s):  
Takashi Tsuboi ◽  
Tetsuo Sakka ◽  
Yukio H. Ogata
Keyword(s):  
Porous Silicon ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Metal Deposition ◽  
Immersion Plating

Immersion plating of nickel onto a porous silicon layer from fluoride solutions

2003 ◽  
Vol 197 (1) ◽  
pp. 51-56 ◽  
Author(s):  
F. A. Harraz ◽  
T. Sakka ◽  
Y. H. Ogata
Keyword(s):  
Porous Silicon ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Immersion Plating

Effect of dopant type on immersion plating into porous silicon layer

1999 ◽  
Vol 147 (1-4) ◽  
pp. 6-13 ◽  
Author(s):  
Takashi Tsuboi ◽  
Tetsuo Sakka ◽  
Yukio H Ogata
Keyword(s):  
Porous Silicon ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Immersion Plating

scholarly journals Catalyst Metal Deposition into Porous Silicon Layer

2005 ◽  
Vol 125 (10) ◽  
pp. 407-412 ◽  
Author(s):  
Masanori Hayase ◽  
Daisuke Saito ◽  
Takeshi Hatsuzawa
Keyword(s):  
Porous Silicon ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Metal Deposition ◽  
Catalyst Metal

Effect of the Porous Silicon Layer Structure on Gas Adsorption

2020 ◽  
Vol 12 (4) ◽  
pp. 04020-1-04020-5
Author(s):  
A. P. Oksanich ◽  
◽  
S. E. Pritchin ◽  
M. A. Mashchenko ◽  
A. Yu. Bobryshev ◽  
...  
Keyword(s):  
Porous Silicon ◽  
Gas Adsorption ◽  
Layer Structure ◽  
Silicon Layer ◽  
Porous Silicon Layer

scholarly journals Morphology and FT IR spectra of porous silicon

2017 ◽  
Vol 68 (7) ◽  
pp. 53-57 ◽  
Author(s):  
Martin Kopani ◽  
Milan Mikula ◽  
Daniel Kosnac ◽  
Jan Gregus ◽  
Emil Pincik
Keyword(s):  
Porous Silicon ◽  
Ir Spectra ◽  
Silicon Layer ◽  
Porous Silicon Layer ◽  
Layer Formation ◽  
Porous Si ◽  
Ft Ir ◽  
P Type ◽  
Type Sample ◽  
Ftir Investigation

AbstractThe morphology and chemical bods of p-type and n-type porous Si was compared. The surface of n-type sample is smooth, homogenous without any features. The surface of p-type sample reveals micrometer-sized islands. FTIR investigation reveals various distribution of SiOxHycomplexes in both p-and n-type samples. From the conditions leading to porous silicon layer formation (the presence of holes) we suggest both SiOxHyand SiFxHycomplexes in the layer.

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