Time-of-flight-photoelectron emission microscopy on plasmonic structures using attosecond extreme ultraviolet pulses

2012 ◽  
Vol 100 (5) ◽  
pp. 051904 ◽  
Author(s):  
F. Süßmann ◽  
C. Späth ◽  
A. Wirth ◽  
J. Schmidt ◽  
S. Zherebtsov ◽  
...  
Keyword(s):  
Extreme Ultraviolet ◽  
Time Of Flight ◽  
Photoelectron Emission ◽  
Plasmonic Structures ◽  
Emission Microscopy ◽  
Photoelectron Emission Microscopy

scholarly journals Energy-filtered Photoelectron Emission Microscopy (EF-PEEM) for imaging nanoelectronic materials

2007 ◽  
Author(s):  
Olivier Renault ◽  
Amal Chabli ◽  
David G. Seiler ◽  
Alain C. Diebold ◽  
Robert McDonald ◽  
...  
Keyword(s):  
Photoelectron Emission ◽  
Emission Microscopy ◽  
Photoelectron Emission Microscopy
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