scholarly journals Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light

1998 ◽  
Vol 83 (3) ◽  
pp. 1171-1176 ◽  
Author(s):  
C. Durkan ◽  
I. V. Shvets
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Sample Type ◽  
Reflection Mode ◽  
Polarization Of Light

Imaging of optical disc using reflection-mode scattering-type scanning near-field optical microscopy

1999 ◽  
Vol 194 (2-3) ◽  
pp. 552-557 ◽  
Author(s):  
Yamaguchi ◽  
Sasaki ◽  
Sasaki ◽  
Konada ◽  
Horikawa ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Reflection Mode ◽  
Optical Disc

Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples

1999 ◽  
Vol 69 (6) ◽  
pp. 581-589 ◽  
Author(s):  
J. Ferber ◽  
U.C. Fischer ◽  
N. Hagedorn ◽  
H. Fuchs
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Internal Reflection ◽  
Reflection Mode

Scanning near-field optical microscopy in reflection mode imaging in liquid

1997 ◽  
Vol 68 (3) ◽  
pp. 1448-1454 ◽  
Author(s):  
Thomas Hans Keller ◽  
Trevor Rayment ◽  
David Klenerman ◽  
Robert J. Stephenson
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Reflection Mode

Topographic cross talk in reflection mode near-field optical microscopy on patterned structures

2001 ◽  
Vol 89 (12) ◽  
pp. 7727-7729 ◽  
Author(s):  
A. Rosenberger ◽  
A. Münnemann ◽  
F. Kiendl ◽  
G. Güntherodt ◽  
P. Rosenbusch ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Cross Talk ◽  
Near Field ◽  
Reflection Mode ◽  
Patterned Structures

scholarly journals Polarization State of Scattered Light in Apertureless Reflection-mode Scanning Near-Field Optical Microscopy

2013 ◽  
Vol 18 (3) ◽  
pp. 317-320 ◽  
Author(s):  
Yongfu Cai ◽  
Mitsuharu Aoyagi ◽  
Akira Emoto ◽  
Tatsutoshi Shioda ◽  
Takayuki Ishibashi
Keyword(s):  
Optical Microscopy ◽  
Scattered Light ◽  
Near Field ◽  
Polarization State ◽  
Reflection Mode

Scanned-tip reflection-mode near-field scanning optical microscopy

1991 ◽  
Vol 38 (3-4) ◽  
pp. 299-304 ◽  
Author(s):  
J.A. Cline ◽  
H. Barshatzky ◽  
M. Isaacson
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Reflection Mode ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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