Note: Intensity control of a phase-shift based laser scanner for reducing distance errors caused by varying surface reflectivity

2011 ◽  
Vol 82 (12) ◽  
pp. 126102 ◽  
Author(s):  
Junhwan Jang ◽  
Sungui Hwang ◽  
Kyihwan Park
Keyword(s):  
Phase Shift ◽  
Laser Scanner ◽  
Intensity Control ◽  
Surface Reflectivity

A phase-shift laser scanner based on a time-counting method for high linearity performance

2011 ◽  
Vol 82 (7) ◽  
pp. 075108 ◽  
Author(s):  
Heesun Yoon ◽  
Hajun Song ◽  
Kyihwan Park
Keyword(s):  
Phase Shift ◽  
Laser Scanner ◽  
Counting Method ◽  
High Linearity

scholarly journals Influence of surface reflectivity on reflectorless electronic distance measurement and terrestrial laser scanning

2014 ◽  
Vol 8 (4) ◽  
Author(s):  
Miriam Zámečníková ◽  
Andreas Wieser ◽  
Helmut Woschitz ◽  
Camillo Ressl
Keyword(s):  
High Precision ◽  
Laser Scanning ◽  
Laser Scanner ◽  
Signal Strength ◽  
Distance Measurement ◽  
Measured Signal ◽  
Systematic Effect ◽  
Surface Reflectivity ◽  
The Impact ◽  
Electronic Distance Measurement

AbstractThe uncertainty of electronic distance measurement to surfaces rather than to dedicated precisionre flectors (reflectorless EDM) is afected by the entire system comprising instrument, atmosphere and surface. The impact of the latter is significant for applications like geodetic monitoring, high-precision surface modelling or laser scanner self-calibration. Nevertheless, it has not yet received sufficient attention and is not well understood. We have carried out an experimental investigation of the impact of surface reflectivity on the distance measurements of a terrestrial laser scanner. The investigation helps to clarify (i)whether variations of reflectivity cause systematic deviations of reflectorless EDM, and (ii) if so, whether it is possible and worth modelling these deviations. The results show that differences in reflectivity may actually cause systematic deviations of a few mm with diffusely re- flecting surfaces and even more with directionally reflecting ones. Using abivariate quadratic polynomial we were able to approximate these deviations as a function of measured distance and measured signal strength alone. Using this approximation to predict corrections, the deviations of the measurements could be reduced by about 70% in our experiment.We conclude that there is a systematic effect of surface reflectivity (or equivalently received signal strength) on the distance measurement and that it is possible to model and predict this effect. Integration into laser scanner calibration models may be beneficial for high precision applications. The results may apply to a broad range of instruments, not only to the specific laser scanner used herein.

scholarly journals A New Approach for Documentation, Conservation and Preservation of the Monolithic Statues in San Agustín as Pilot for Outdoor Cultural Heritage Documentation in Colombia

2014 ◽  
Vol XL-5 ◽  
pp. 225-229
Author(s):  
A. Estela ◽  
J. Hamacher
Keyword(s):  
Phase Shift ◽  
Data Acquisition ◽  
New Technologies ◽  
Three Dimensional ◽  
Laser Scanner ◽  
3D Models ◽  
New Approach ◽  
Heritage Sites ◽  
3D Data ◽  
Three Dimensional Models

The "Instituto Colombiano de Antropología e Historia" (ICANH) started a new conservation project for the "San Agustín Archaeological Park" (Huila, Colombia) in 2013. The objectives of this project are the documentation, conservation, and preservation of the numerous monolithic statues mainly by integrating the use of new technologies (3D models). A first phase of the project has been completed, resulting in three-dimensional models of 66 of the monolithic sculptures in San Agustín. The methodology developed in this first phase will show the way for other heritage sites in Colombia and for subsequent phases applied to the archaeological park. The 3D data has been obtained using two types of data acquisition technology: the Mantis Vision F5 using infrared structured-light (SL) and a laser scanner based on the phase shift (PS) technology, the Z+F Imager 5010. The results show that future phases need improvement in data acquisition. Mainly the data obtained with the hand held scanner shows many lacunae. This article presents the observations during data processing on the basis of one sculpture, "Escultura 23". In conclusion, this first phase showed where to improve for the succeeding ones, for instance the detail of the meshes need to be increased if the models are to be used for detailed conservation and preservation purposes.

Object Wave Determination by Single-Sideband Methods

1973 ◽  
Vol 31 ◽  
pp. 266-267
Author(s):  
Kenneth H. Downing ◽  
Benjamin M. Siegel
Keyword(s):  
Phase Shift ◽  
Carbon Films ◽  
Object Wave ◽  
Electron Wave ◽  
Phase Object ◽  
Heavy Atoms ◽  
Single Sideband ◽  
Thin Carbon ◽  
Additional Phase Shift ◽  
Additional Phase

Under the “weak phase object” approximation, the component of the electron wave scattered by an object is phase shifted by π/2 with respect to the unscattered component. This phase shift has been confirmed for thin carbon films by many experiments dealing with image contrast and the contrast transfer theory. There is also an additional phase shift which is a function of the atomic number of the scattering atom. This shift is negligible for light atoms such as carbon, but becomes significant for heavy atoms as used for stains for biological specimens. The light elements are imaged as phase objects, while those atoms scattering with a larger phase shift may be imaged as amplitude objects. There is a great deal of interest in determining the complete object wave, i.e., both the phase and amplitude components of the electron wave leaving the object.

A Many-Beam Technique for Enhanced Resolution of Partial Dislocations

1972 ◽  
Vol 30 ◽  
pp. 646-647
Author(s):  
J. M. Oblak ◽  
B. H. Kear
Keyword(s):  
Phase Shift ◽  
Field Method ◽  
Dark Field ◽  
Bright Field ◽  
Field Technique ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Enhanced Resolution ◽  
Nickel Base ◽  
Beam Technique

The “weak-beam” and systematic many-beam techniques are the currently available methods for resolution of closely spaced dislocations or other inhomogeneities imaged through strain contrast. The former is a dark field technique and image intensities are usually very weak. The latter is a bright field technique, but generally use of a high voltage instrument is required. In what follows a bright field method for obtaining enhanced resolution of partial dislocations at 100 KV accelerating potential will be described.A brief discussion of an application will first be given. A study of intermediate temperature creep processes in commercial nickel-base alloys strengthened by the Ll2 Ni3 Al γ precipitate has suggested that partial dislocations such as those labelled 1 and 2 in Fig. 1(a) are in reality composed of two closely spaced a/6 <112> Shockley partials. Stacking fault contrast, when present, tends to obscure resolution of the partials; thus, conditions for resolution must be chosen such that the phase shift at the fault is 0 or a multiple of 2π.

Observation of surface morphology by reflection electron holography

1989 ◽  
Vol 47 ◽  
pp. 536-537
Author(s):  
N. Osakabe ◽  
J. Endo ◽  
T. Matsuda ◽  
A. Tonomura
Keyword(s):  
Phase Shift ◽  
Surface Morphology ◽  
High Sensitivity ◽  
High Energy ◽  
Path Difference ◽  
Transmission Mode ◽  
Electron Holography ◽  
Dynamical Process ◽  
High Vertical Resolution ◽  
Amplification Technique

Progress in microscopy such as STM and TEM-TED has revealed surface structures in atomic dimension. REM has been used for the observation of surface dynamical process and surface morphology. Recently developed reflection electron holography, which employes REM optics to measure the phase shift of reflected electron, has been proved to be effective for the observation of surface morphology in high vertical resolution ≃ 0.01 Å.The key to the high sensitivity of the method is best shown by comparing the phase shift generation by surface topography with that in transmission mode. Difference in refractive index between vacuum and material Vo/2E≃10-4 owes the phase shift in transmission mode as shownn Fig. 1( a). While geometrical path difference is created in reflection mode( Fig. 1(b) ), which is measured interferometrically using high energy electron beam of wavelength ≃0.01 Å. Together with the phase amplification technique , the vertivcal resolution is expected to be ≤0.01 Å in an ideal case.

Inelastic mean free path and phase-shift determinations in NiO, using EXELFS

1993 ◽  
Vol 3 (7) ◽  
pp. 1649-1659
Author(s):  
Mohammad A. Tafreshi ◽  
Stefan Csillag ◽  
Zou Wei Yuan ◽  
Christian Bohm ◽  
Elisabeth Lefèvre ◽  
...  
Keyword(s):  
Phase Shift ◽  
Free Path ◽  
Mean Free Path ◽  
Inelastic Mean Free Path
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