AbstractField emission from wide bandgap materials was investigated through voltage dependent field emission energy distribution (V-FEED) analysis. As compared to classical I-V characterization, V-FEED analysis can provide additional, detailed information about the origin of and the mechanism responsible for the field emission of electrons. The V-FEED technique consists of measuring the energy distribution of field emitted electrons collected at various extraction voltages. By measuring changes in the energy of the field emission peak at different voltages, data can be extrapolated to flat-band condition to determine the energy of the band from which the electron emission originated. In this study, field emission from cubic boron nitride (c-BN) coated and diamond coated tip-shaped Mo emitters was examined. For the nominally intrinsic wide bandgap coating materials studied, a linear voltage drop across the wide bandgap material, usually on the order of 1% of extraction voltage was observed and explained by field induced band-bending. For the intrinsic c-BN and diamond samples studied, the electron emission originated from the conduction band minimum at the wide bandgap material/vacuum interface.