Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor

1997 ◽  
Vol 82 (3) ◽  
pp. 980-984 ◽  
Author(s):  
Hal Edwards ◽  
Larry Taylor ◽  
Walter Duncan ◽  
Allan J. Melmed
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force

Tip-Substrate Shear Interaction in Quartz Tuning Fork-Based Atomic Force Microscopy in Air

2021 ◽  
Vol 71 (5) ◽  
pp. 439-445
Author(s):  
Hyoju CHOE ◽  
Dongwon KIM ◽  
Manhee LEE* ◽  
Myungchul CHOI
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force

Eigenvalue Veering in Quartz Tuning Fork Sensors and its Effect on Dynamic Atomic Force Microscopy

2014 ◽  
Author(s):  
John Melcher
Keyword(s):  
Atomic Force Microscopy ◽  
Resonant Frequency ◽  
Systematic Error ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Attractive Alternative ◽  
Small Shift ◽  
Force Microscopy ◽  
Sensing Applications ◽  
Atomic Force

Quartz tuning fork (QTF) sensors offer an attractive alternative to traditional silicon microcantilevers for sensing applications in dynamic atomic force microscopy (DAFM). The QTF sensor consists of two identical, weakly-coupled tines with a sharp tip affixed to the distal end of one tine. The fundamental anti-phase mode of the QTF achieves a stable resonant frequency with a high Quality factor making it ideal for DAFM applications in which a small shift in the resonant frequency is linked to a tip-sample force. The addition of the tip-sample force also breaks the symmetry of the QTF leading to a classic eigenvalue veering scenario. The eigenvalue veering and accompanying mode localization phenomena violate the standard DAFM modeling assumptions which treat the addition of the tip-sample force as a small perturbation to a single-degree-of-freedom oscillator. We find that the eigenvalue veering can contribute a systematic error in force measurements on the order of 20%. Methodology for correcting the systematic error caused by eigenvalue veering is proposed.

Frequency Modulation Atomic Force Microscopy in Ionic Liquid Using Quartz Tuning Fork Sensors

2012 ◽  
Vol 51 (8S3) ◽  
pp. 08KB08 ◽  
Author(s):  
Takashi Ichii ◽  
Motohiko Fujimura ◽  
Masahiro Negami ◽  
Kuniaki Murase ◽  
Hiroyuki Sugimura
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Frequency Modulation ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force
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