Accurate method for the determination of bulk minority-carrier lifetimes of mono- and multicrystalline silicon wafers

1997 ◽  
Vol 81 (9) ◽  
pp. 6186-6199 ◽  
Author(s):  
Jan Schmidt ◽  
Armin G. Aberle
1996 ◽  
Vol 69 (22) ◽  
pp. 3375-3377 ◽  
Author(s):  
K. Puech ◽  
S. Zott ◽  
K. Leo ◽  
M. Ruckh ◽  
H.‐W. Schock

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