Deposition condition and thickness dependence on magnetic properties of sputtered NiFeCo thin films

1996 ◽  
Vol 79 (8) ◽  
pp. 5446 ◽  
Author(s):  
A. Tsoukatos ◽  
S. Gupta ◽  
Y. K. Kim
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Thickness Dependence ◽  
Deposition Condition

A study on the thickness dependence of static and dynamic magnetic properties of Ni81Fe19 thin films

2016 ◽  
Vol 419 ◽  
pp. 456-463 ◽  
Author(s):  
P.R. Kern ◽  
O.E. da Silva ◽  
J.V. de Siqueira ◽  
R.D. Della Pace ◽  
J.N. Rigue ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Thickness Dependence

Thickness dependence of the magnetic properties in YBa2Cu3O7−δ thin films

1997 ◽  
Vol 282-287 ◽  
pp. 2215-2216 ◽  
Author(s):  
R. Prozorov ◽  
E. Sheriff ◽  
Y. Yeshurun ◽  
A. Shaulov
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Thickness Dependence

scholarly journals Thickness dependence of microstructures and magnetic properties for CoPt/Ag nanocomposite thin films

2010 ◽  
Vol 518 (24) ◽  
pp. 7356-7359 ◽  
Author(s):  
C.L. Shen ◽  
P.C. Kuo ◽  
Y.S. Li ◽  
G.P. Lin ◽  
S.L. Ou ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Thickness Dependence ◽  
Nanocomposite Thin Films

Thickness dependence of microstructure and magnetic properties in FePt/B4C multilayer thin films

2008 ◽  
Vol 94 (4) ◽  
pp. 981-985
Author(s):  
Fujun Yang ◽  
Hao Wang ◽  
Baoyuan Wang ◽  
Haoshuang Gu ◽  
Mingjie Zhou ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Thickness Dependence ◽  
Multilayer Thin Films ◽  
Microstructure And Magnetic Properties

Thickness Dependence of Magnetic Properties of Co90Fe10 Nanoscale Thin Films

2008 ◽  
Vol 8 (2) ◽  
pp. 841-845 ◽  
Author(s):  
O. Yalçin ◽  
S. Kazan ◽  
R. Şahingöz ◽  
F. Yıldız ◽  
Y. Yerli ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Room Temperature ◽  
Resonance Field ◽  
Thickness Dependence ◽  
Si Substrate ◽  
Damping Term ◽  
Individual Layer ◽  
X Band ◽  
Effective Magnetization

Ferromagnetic monolayers Co90Fe10 thin films with individual layer thicknesses 2, 6, and 8 nm were grown on thermally oxidized Si substrate and magnetic properties of these were investigated with Ferromagnetic resonance (FMR) technique at room temperature. The magnetoresistance (MR) of the samples were measured as a function of applied DC magnetic field and the thickness dependence of the MR was plotted. The FMR spectra were recorded for both parallel and perpendicular geometry. The X-band (9.5 GHz) FMR spectra and resonance field of samples were analyzed and fitted theoretically by using the Landau-Lifshits dynamic equation of motion for magnetization with the Bloch-Bloembergen type damping term. The computer programs have been written to extract the effective magnetization (M), g-values and spin–spin relaxation time (T2) fitting parameters. The thickness dependence of magnetic parameters has been obtained from experimental data by mean of a theoretical model.

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