Temperature dependence dynamical permeability characterization of magnetic thin film using near-field microwave microscopy

2011 ◽  
Vol 82 (8) ◽  
pp. 084701 ◽  
Author(s):  
Le Thanh Hung ◽  
Nguyen N. Phuoc ◽  
Xuan-Cong Wang ◽  
C. K. Ong
Keyword(s):  
Thin Film ◽  
Temperature Dependence ◽  
Near Field ◽  
Magnetic Thin Film ◽  
Microwave Microscopy

Near-field optical characterization of interacting and non-interacting gold nanoparticles embedded in a silica thin film

2011 ◽  
Vol 284 (12) ◽  
pp. 3118-3123
Author(s):  
Loic Lalouat ◽  
Laurent Billot ◽  
Lionel Aigouy ◽  
Francesco Pineider ◽  
César de Julián Fernández ◽  
...  
Keyword(s):  
Thin Film ◽  
Gold Nanoparticles ◽  
Near Field ◽  
Optical Characterization ◽  
Silica Thin Film

scholarly journals Особенности нелинейного СВЧ-отклика многозонных сверхпроводников на основе ферроселенида натрия-калия (Na-=SUB=-0.3-=/SUB=-K-=SUB=-0.7-=/SUB=-)-=SUB=-x-=/SUB=-Fe-=SUB=-2-y-=/SUB=-Se-=SUB=-2-=/SUB=-

2018 ◽  
Vol 60 (11) ◽  
pp. 2116
Author(s):  
Е.Е. Пестов ◽  
Ю.Н. Ноздрин ◽  
А.И. Елькина ◽  
Ю.C. Ерин ◽  
М. Лю ◽  
...  
Keyword(s):  
Magnetic Susceptibility ◽  
Temperature Dependence ◽  
Single Crystals ◽  
Near Field ◽  
Sodium Potassium ◽  
Third Harmonic ◽  
The Third ◽  
Microwave Microscopy ◽  
Temperature Dependences ◽  
Harmonic Power

Abstract —Temperature dependences of the third-harmonic power for the (Na_0.3K_0.7)_ x Fe_2 – _ y Se_2 sodium–potassium ferroselenide single crystals have been investigated by nonlinear near-field microwave microscopy. The temperature dependence of magnetic susceptibility at a frequency of 100 kHz for this compound has been measured. The experimental results suggest a double-gap structure of the (Na_0.3K_0.7)_ x Fe_2 – _ y Se_2 superconductor.

Recursive Image Charge Approach for Quantitative Characterization of Dielectric Thin Film Library Using Scanning Tip Microwave Near-field Microscopy

2003 ◽  
Vol 804 ◽  
Author(s):  
Chen Gao ◽  
Bo Hu ◽  
Mengming Huang ◽  
Pu Zhang ◽  
Wen-han Liu
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Dielectric Constant ◽  
Near Field ◽  
Image Charge ◽  
Film Library ◽  
Quantitative Characterization ◽  
Dielectric Thin Films ◽  
Dielectric Thin Film

ABSTRACTWe developed a recursive image charge approach for quantitative characterizations of dielectric thin films using the scanning tip microwave near-field microscope. With this method, frequency shift of the microscope as functions of the dielectric constant and the thickness of a film can be effectively computed in a recursive way. We believe that this approach can promote the high-throughput characterization of the dielectric libraries.

High frequency dielectric properties distribution of BiFeO3 thin film using near-field microwave microscopy

2009 ◽  
Vol 80 (11) ◽  
pp. 114701 ◽  
Author(s):  
Xiao-Yu Zhang ◽  
Xuan-Cong Wang ◽  
Feng Xu ◽  
Yun-Gui Ma ◽  
C. K. Ong
Keyword(s):  
Thin Film ◽  
Dielectric Properties ◽  
High Frequency ◽  
Near Field ◽  
Bifeo3 Thin Film ◽  
Microwave Microscopy

Near-field microwave microscopy for the characterization of dielectric materials

2014 ◽  
Vol 6 (6) ◽  
pp. 549-554 ◽  
Author(s):  
Jamal Rammal ◽  
Olivier Tantot ◽  
Nicolas Delhote ◽  
Serge Verdeyme
Keyword(s):  
Resonance Frequency ◽  
Dielectric Resonator ◽  
High Spatial Resolution ◽  
Near Field ◽  
Dielectric Materials ◽  
Microwave Microscopy ◽  
Knowing That ◽  
Resonance Frequencies ◽  
Microscopy Method

In this paper, we present a near-field microwave microscopy method for the characterization of dielectric materials samples in the Industrial, Scientific and Medical (ISM) band. The system proposed is composed of a probe coupled to a dielectric resonator (DR) operating in the TE011mode. Latter this is used to fix the resonance frequency of the resonator at 2.45 GHz. This system is used for the characterization of dielectric samples with accuracy and high spatial resolution, knowing that they do not have predetermined forms, but a small plane surface.The same device is used for a multi-frequency characterization (4–20 GHz) using resonance frequencies of the cavity instead of one resonance frequency of the DR.

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