scholarly journals Response to the “Comment on ‘Thermal frequency noise in dynamic scanning force microscopy’” [J. Appl. Phys. 110, 036107 (2011)]

2011 ◽  
Vol 110 (3) ◽  
pp. 036108 ◽  
Author(s):  
J. Colchero ◽  
Juan Francisco González Martínez ◽  
José Abad ◽  
B. Pérez García ◽  
M. Cuenca ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Frequency Noise ◽  
Force Microscopy ◽  
Scanning Force ◽  
Dynamic Scanning

Thermal frequency noise in dynamic scanning force microscopy

2011 ◽  
Vol 109 (2) ◽  
pp. 024310 ◽  
Author(s):  
J. Colchero ◽  
M. Cuenca ◽  
J. F. González Martínez ◽  
J. Abad ◽  
B. Pérez García ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Frequency Noise ◽  
Force Microscopy ◽  
Scanning Force ◽  
Dynamic Scanning

scholarly journals Molecular-resolution imaging of pentacene on KCl(001)

2012 ◽  
Vol 3 ◽  
pp. 186-191 ◽  
Author(s):  
Julia L Neff ◽  
Jan Götzen ◽  
Enhui Li ◽  
Michael Marz ◽  
Regina Hoffmann-Vogel
Keyword(s):  
High Resolution ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Molecular Arrangement ◽  
Domain Boundaries ◽  
Different Types ◽  
Scanning Force ◽  
High Resolution Images ◽  
Resolution Imaging ◽  
Dynamic Scanning

The growth of pentacene on KCl(001) at submonolayer coverage was studied by dynamic scanning force microscopy. At coverages below one monolayer pentacene was found to arrange in islands with an upright configuration. The molecular arrangement was resolved in high-resolution images. In these images two different types of patterns were observed, which switch repeatedly. In addition, defects were found, such as a molecular vacancy and domain boundaries.

scholarly journals Calibration of oscillation amplitude in dynamic scanning force microscopy

2013 ◽  
Vol 24 (18) ◽  
pp. 185701 ◽  
Author(s):  
Juan Francisco González Martínez ◽  
Inés Nieto-Carvajal ◽  
Jaime Colchero
Keyword(s):  
Oscillation Amplitude ◽  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Dynamic Scanning

Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?

2010 ◽  
Vol 110 (7) ◽  
pp. 789-800 ◽  
Author(s):  
E. Palacios-Lidón ◽  
C. Munuera ◽  
C. Ocal ◽  
J. Colchero
Keyword(s):  
Scanning Force Microscopy ◽  
Force Microscopy ◽  
Scanning Force ◽  
Dynamic Scanning ◽  
Contrast Inversion
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