Abnormal switching of ferroelectric domains created by the tip of an atomic force microscope in a congruent LiTaO3 single-crystal thin film

2011 ◽  
Vol 110 (2) ◽  
pp. 024102 ◽  
Author(s):  
Antoine Brugère, ◽  
Serge Gidon, ◽  
Brice Gautier
Keyword(s):  
Thin Film ◽  
Single Crystal ◽  
Atomic Force Microscope ◽  
Atomic Force ◽  
Ferroelectric Domains

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

The Nanostructure Fabrication on Conductive Diamond-like Carbon Thin Film by Nano-Oxidation Technique

2014 ◽  
Vol 939 ◽  
pp. 671-678
Author(s):  
Jen Ching Huang ◽  
Ho Chang ◽  
Hui Ti Ling
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
Applied Voltage ◽  
Processing Parameters ◽  
Atmospheric Environment ◽  
High Wear Resistance ◽  
Mold Material ◽  
Diamond Like Carbon ◽  
Atomic Force ◽  
Carbon Thin Film

This paper mainly focuses in the use of an atomic force microscope, research about the nanooxidation technique of conductive diamond-like carbon thin film in the atmospheric environment. The hardness, high wear resistance and chemical stability of diamond-like carbon thin film is high, and coefficient of friction is low, it is very suitable as a mold material for nanoscale mold. However, tool can only use a diamond cutter to machine the high hardness diamond-like carbon by traditional hard machining method, and tool life is not long. To overcome this drawback, the paper proposed an atomic force microscope (AFM) as a platform, a conductive AFM probe for tool under atmospheric conditions, and imposed nanooxidation technique on conductive diamond-like carbon thin film using electroluminescent etching to carry out nanofabrication processing. During the nanofabrication process, by changing the various processing parameters, such as applied voltage, repeated nanooxidation times and probe speed, etc., in order to understand the effect of processing parameters. The experimental results show, the nanooxidation technique can be carried out nanofabrication on conductive diamond-like carbon thin film successfully. And found that applied voltage, repeated nanooxidation times and probe speed all for the groove depth on the conductive diamond-like carbon thin films have significant influence. Additionally, this study successfully created a nanopattern. Therefore, the adequate machinability of DLC coating was achieved successfully in this study, indicating a promising application in the fabrication of nanopatterns on a nanoscale.

Nanostructures Fabrication on Ta Thin Film Using Atomic Force Microscope Lithography

2006 ◽  
Vol 445 (1) ◽  
pp. 115/[405]-118/[408]
Author(s):  
Sunwoo Lee ◽  
Haiwon Lee ◽  
Do Haing Lee ◽  
Byung-Jae Park ◽  
Geun Young Yeom
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
Atomic Force

Molecular Arrangement at Cleaved Single-Crystal Surface of Steraric Acid Observed by Atomic Force Microscope

1994 ◽  
Vol 33 (Part 1, No. 6B) ◽  
pp. 3768-3770 ◽  
Author(s):  
Masatoshi Fujii ◽  
Yasuhiro Fujihara ◽  
Satoshi Sugisawa ◽  
Kazuhiro Fukada ◽  
Tadashi Kato ◽  
...  
Keyword(s):  
Single Crystal ◽  
Atomic Force Microscope ◽  
Crystal Surface ◽  
Single Crystal Surface ◽  
Molecular Arrangement ◽  
Atomic Force

Interaction Force Between Thin Film Disk Media and Elastic Solids Investigated by Atomic Force Microscope

1990 ◽  
Vol 112 (3) ◽  
pp. 567-572 ◽  
Author(s):  
T. Miyamoto ◽  
R. Kaneko ◽  
Y. Ando
Keyword(s):  
Thin Film ◽  
Single Crystal ◽  
Single Crystal Silicon ◽  
Static Friction ◽  
Interaction Force ◽  
Elastic Solids ◽  
Crystal Silicon ◽  
Interaction Forces ◽  
Liquid Lubricant ◽  
Atomic Force

Atomic force microscopy is used to investigate the interaction force between the sharp tips of various elastic solids and four different samples. The samples are: thin film disk media coated with functional liquid lubricant having diol end groups, unlubricated disk media, a single-crystal silicon wafer, and Au evaporated onto single-crystal silicon. Relationships between the interaction and static friction force of disk media and a taper flat type head slider are examined. The interaction force between a disk medium coated with a functional liquid lubricant greater than 11.0 nm thick and tungsten tips with radii of 5 μm-100 μm is caused by the functional liquid lubricant meniscus, as pointed out by McFarlane and Tabor. However, at a thickness of several nanometers, the interaction force has a lower value than that for lubricant thicknesses above 11.0 nm. The interaction force has a minimum value of 0.4 μN at the functional liquid lubricant thickness of 2.0 nm. Mean interaction forces of the tungsten, Al2O3 − TiC and Si3N4 tips on a disk medium coated with a 2.0-nm-thick functional liquid lubricant are less than 0.1 times those for an unlubricated disk medium. Interaction forces of the SiC tip show very low values, even when the disk medium is unlubricated. Static friction force between a thin-film disk medium and a head or sphere is dependent on the interaction force between the medium and a tip that is made of the same material as the head or sphere. The use of an atomic force microscope (AFM), may allow the surface structure to be more thoroughly analyzed.

Single Crystal Quartz a Replacement for Diamond Optical Windows

2008 ◽  
Author(s):  
Jessica Sheehan
Keyword(s):  
Single Crystal ◽  
Atomic Force Microscope ◽  
Surface Defect ◽  
High Pressures ◽  
Modulus Of Rupture ◽  
Surface Conditions ◽  
Atomic Force ◽  
Single Crystal Quartz ◽  
Expected Values ◽  
Crystal Quartz

Diamond windows are used extensively in the field of optics due to their high transmittance and durability. However, despite their ability to withstand high pressures, diamond windows are not scratch resistant and need to be replaced when the surface is damaged. Moreover, the high cost of diamond windows necessitates extra care to protect the windows and limits the practical size of the window or lens. Thus, alternatives to the highly expensive diamond windows are needed in the optical sciences. A study of single crystal quartz has been conducted to determine if it will make a suitable replacement material. Since the transmittance of single crystal quartz is well documented and desirable for this application, only strength and surface defect experiments were conducted. Trials were run to determine the modulus of rupture of single crystal quartz samples which were also examined with an interferometer and an atomic force microscope (AFM) to correlate the surface conditions with the modulus of rupture. The results showed that even relatively numerous and large defects on the surface did resulted in single crystal quartz holding to high pressures. In addition, the measured modulus of rupture far exceeded the expected values proving that the single crystal quartz is able to withstand the pressures of vacuum. Single crystal quartz is thus found to be a viable alternative to diamond optical windows.

Grains Observation Using FIB Anisotropic Etch Followed by AFM Imaging

1996 ◽  
Author(s):  
H. Yamashita ◽  
Y. Hata
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
Conventional Technique ◽  
Wet Etching ◽  
Atomic Scale ◽  
Atomic Force ◽  
Afm Imaging ◽  
Al Thin Film ◽  
Anisotropic Etch ◽  
Afm Observation

Abstract It is becoming more important to observe structures and failed sites in LSIs. An atomic force microscope (AFM) can obtain atomic scale topographic images on sample surfaces. To analyze failures in LSIs, several treatments for the AFM observation, such as wet etching and mechanical polishing for a crosssectional imaging, have been proposed so far. A good correlation of AFM images using FIB anisotropic etch with those acquired by conventional technique such as SIM and TEM has been demonstrated A crystallographic information about Al thin film is obtained by AFM using this technique.

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