Short-range order in amorphous SiOx by x ray photoelectron spectroscopy

2011 ◽  
Vol 110 (1) ◽  
pp. 014107 ◽  
Author(s):  
Yu. N. Novikov ◽  
V. A. Gritsenko
Keyword(s):  
Photoelectron Spectroscopy ◽  
Short Range ◽  
Short Range Order ◽  
Range Order ◽  
X Ray

Studies of short-range order in amorphous Ge x Se100−x compounds by X-ray photoelectron spectroscopy

1994 ◽  
Vol 69 (2) ◽  
pp. 209-222 ◽  
Author(s):  
Marie-Luce Theye ◽  
Adriana Gheorghiu ◽  
Christiane Senemaud ◽  
Mohamed F. Kotkata ◽  
Kandil M. Kandil
Keyword(s):  
Photoelectron Spectroscopy ◽  
Short Range ◽  
Short Range Order ◽  
Range Order ◽  
X Ray

Short-range order and electronic structure of radiation-damaged zircon according to X-ray photoelectron spectroscopy

2020 ◽  
Vol 47 (12) ◽  
Author(s):  
Yuliya V. Shchapova ◽  
Dmitry A. Zamyatin ◽  
Sergey L. Votyakov ◽  
Ivan S. Zhidkov ◽  
Andrey I. Kuharenko ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Photoelectron Spectroscopy ◽  
Short Range ◽  
Short Range Order ◽  
Range Order ◽  
X Ray

Short-range order evolution in S-rich Ge–S glasses by X-ray photoelectron spectroscopy

2011 ◽  
Vol 357 (7) ◽  
pp. 1797-1803 ◽  
Author(s):  
R. Golovchak ◽  
O. Shpotyuk ◽  
S. Kozyukhin ◽  
M. Shpotyuk ◽  
A. Kovalskiy ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Short Range ◽  
Short Range Order ◽  
Range Order ◽  
X Ray

Short-range order in some alloys of the Ge-As-Te semiconducting glassy system by X-ray diffraction

1987 ◽  
Vol 22 (12) ◽  
pp. 4357-4361 ◽  
Author(s):  
R. A. Ligero ◽  
J. Vázquez ◽  
P. Villares ◽  
R. Jimńez-Garay
Keyword(s):  
Short Range ◽  
Short Range Order ◽  
Range Order ◽  
X Ray Diffraction ◽  
Glassy System ◽  
X Ray

Short-range order in some polymer melts from X-ray diffraction

1996 ◽  
Vol 34 (17) ◽  
pp. 3055-3061 ◽  
Author(s):  
J. D. Londono ◽  
A. Habenschuss ◽  
J. G. Curro ◽  
J. J. Rajasekaran
Keyword(s):  
Short Range ◽  
Short Range Order ◽  
Polymer Melts ◽  
Range Order ◽  
X Ray Diffraction ◽  
X Ray

Short‐range order in submonolayer Ni on GaAs(110) by x‐ray photoelectron forward scattering

1988 ◽  
Vol 6 (3) ◽  
pp. 1495-1498 ◽  
Author(s):  
W. F. Egelhoff ◽  
D. A. Steigerwald ◽  
J. E. Rowe ◽  
T. D. Bussing
Keyword(s):  
Short Range ◽  
Short Range Order ◽  
Forward Scattering ◽  
Range Order ◽  
X Ray

scholarly journals X-ray diffraction study of structure of CaO-Al2O3-SiO2 ternary compounds in molten and crystalline states

2020 ◽  
Vol 56 (2) ◽  
pp. 269-277
Author(s):  
V.E. Sokol’skii ◽  
D.V. Pruttskov ◽  
O.M. Yakovenko ◽  
V.P. Kazimirov ◽  
O.S. Roik ◽  
...  
Keyword(s):  
Short Range ◽  
Room Temperature ◽  
Short Range Order ◽  
Structural Parameters ◽  
Range Order ◽  
Reverse Monte Carlo ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Ternary Compounds

Anorthite and gehlenite crystalline structure and short-range order of anorthite melt have been studied by X-ray diffraction in the temperature range from room temperature up to ~ 1923 K. The corresponding anorthite and gehlenite phases were identified as well as amorphous component for anorthite samples having identical shape to XRD pattern of the anorthite melt. The structure factor and the radial distribution function of atoms of the anorthite melt were calculated from the X-ray high-temperature experimental data. The partial structural parameters of the short-range order of the melt were reconstructed using Reverse Monte Carlo simulations.

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