Effect of rapid thermal annealing on the structural and electrical properties of a silicon‐silicon oxide system
2011 ◽
Vol 257
(14)
◽
pp. 5927-5930
◽
1998 ◽
Vol 15
(2)
◽
pp. 217-222
◽
2012 ◽
Vol 45
(22)
◽
pp. 225302
◽
1997 ◽
Vol 300
(1-2)
◽
pp. 272-277
◽
2008 ◽
Vol 20
(11)
◽
pp. 1129-1134
◽
2017 ◽
Vol 178
◽
pp. 012009
◽
2001 ◽
Vol 40
(Part 1, No. 7)
◽
pp. 4450-4453