Determination of depth profiles of E″ defects in irradiated vitreous silica by electron paramagnetic‐resonance imaging

1995 ◽  
Vol 77 (2) ◽  
pp. 790-794 ◽  
Author(s):  
Minoru Sueki ◽  
William R. Austin ◽  
Lin Zhang ◽  
David B. Kerwin ◽  
Robert G. Leisure ◽  
...  
2013 ◽  
Vol 72 (3) ◽  
pp. 893-901 ◽  
Author(s):  
David H. Johnson ◽  
Rizwan Ahmad ◽  
Guanglong He ◽  
Alexandre Samouilov ◽  
Jay L. Zweier

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