Real-space mapping of dynamic phenomena during hysteresis loop measurements: Dynamic switching spectroscopy piezoresponse force microscopy

2011 ◽  
Vol 98 (20) ◽  
pp. 202903 ◽  
Author(s):  
A. Kumar ◽  
O. S. Ovchinnikov ◽  
H. Funakubo ◽  
S. Jesse ◽  
S. V. Kalinin
Keyword(s):  
Hysteresis Loop ◽  
Piezoresponse Force Microscopy ◽  
Real Space ◽  
Space Mapping ◽  
Force Microscopy ◽  
Dynamic Switching ◽  
Dynamic Phenomena

Electrostatic contribution to hysteresis loop in piezoresponse force microscopy

2019 ◽  
Vol 114 (15) ◽  
pp. 152901 ◽  
Author(s):  
Huimin Qiao ◽  
Daehee Seol ◽  
Changhyo Sun ◽  
Yunseok Kim
Keyword(s):  
Hysteresis Loop ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Electrostatic Contribution

Role of measurement voltage on hysteresis loop shape in Piezoresponse Force Microscopy

2012 ◽  
Vol 101 (19) ◽  
pp. 192902 ◽  
Author(s):  
E. Strelcov ◽  
Y. Kim ◽  
J. C. Yang ◽  
Y. H. Chu ◽  
P. Yu ◽  
...  
Keyword(s):  
Hysteresis Loop ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Loop Shape

scholarly journals Real space mapping of polarization dynamics and hysteresis loop formation in relaxor-ferroelectric PbMg1/3Nb2/3O3–PbTiO3 solid solutions

2010 ◽  
Vol 108 (4) ◽  
pp. 042006 ◽  
Author(s):  
B. J. Rodriguez ◽  
S. Jesse ◽  
A. N. Morozovska ◽  
S. V. Svechnikov ◽  
D. A. Kiselev ◽  
...  
Keyword(s):  
Hysteresis Loop ◽  
Solid Solutions ◽  
Real Space ◽  
Relaxor Ferroelectric ◽  
Space Mapping ◽  
Loop Formation

Development of the UHV-STM

1990 ◽  
Vol 48 (1) ◽  
pp. 322-323
Author(s):  
M. Iwatsuki ◽  
S. Kitamura ◽  
A. Mogami
Keyword(s):  
Surface Science ◽  
Real Space ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Great Promise ◽  
Force Microscopy ◽  
Atomic Force ◽  
Stm Image ◽  
Surface Construction ◽  
Very High

Since Binnig, Rohrer and associates observed real-space topographic images of Si(111)-7×7 and invented the scanning tunneling microscope (STM),1) the STM has been accepted as a powerful surface science instrument.Recently, many application areas for the STM have been opened up, such as atomic force microscopy (AFM), magnetic force microscopy (MFM) and others. So, the STM technology holds a great promise for the future.The great advantages of the STM are its high spatial resolution in the lateral and vertical directions on the atomic scale. However, the STM has difficulty in identifying atomic images in a desired area because it uses piezoelectric (PZT) elements as a scanner.On the other hand, the demand to observe specimens under UHV condition has grown, along with the advent of the STM technology. The requirment of UHV-STM is especially very high in to study of surface construction of semiconductors and superconducting materials on the atomic scale. In order to improve the STM image quality by keeping the specimen and tip surfaces clean, we have built a new UHV-STM (JSTM-4000XV) system which is provided with other surface analysis capability.

In-plane polarization contribution to the vertical piezoresponse force microscopy signal mediated by the cantilever “buckling”

2021 ◽  
Vol 543 ◽  
pp. 148808
Author(s):  
D.O. Alikin ◽  
L.V. Gimadeeva ◽  
A.V. Ankudinov ◽  
Q. Hu ◽  
V.Ya. Shur ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Polarization Contribution
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