Analysis of the thickness dependence of critical current density for electrophoretically deposited YBa2Cu3O7−xfilms
2008 ◽
Vol 22
(1)
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pp. 015024
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2019 ◽
Vol 1293
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pp. 012017
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Vol 22
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pp. 045026
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2008 ◽
Vol 97
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pp. 012259
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