Real‐structure effects in the dynamical theory of grazing incidence x‐ray diffraction

1994 ◽  
Vol 76 (12) ◽  
pp. 7809-7815 ◽  
Author(s):  
S. A. Stepanov ◽  
R. Köhler
Keyword(s):  
Grazing Incidence ◽  
Dynamical Theory ◽  
Real Structure ◽  
X Ray Diffraction ◽  
X Ray

Dynamic Theory of Asymetric X-Ray Diffraction for Strained Crystal Wafers

1987 ◽  
Vol 31 ◽  
pp. 161-165 ◽  
Author(s):  
D. W. Berreman ◽  
A. T. Macrander
Keyword(s):  
Numerical Solution ◽  
Matrix Method ◽  
Dynamic Theory ◽  
Grazing Incidence ◽  
Dynamical Theory ◽  
Matrix Approach ◽  
X Ray Diffraction ◽  
General Matrix ◽  
X Ray ◽  
Strained Crystal

A very accurate 8X8 matrix approach to dynamical theory of X-ray diffraction in which fewer approximations are made than in the classic vonLaue approach, is described here. The method is related to the very general matrix method of Kokushima and Yamakito, and is particularly suited to numerical solution with a computer. It can be used to solve problems in ideal, undistorted crystals with high precision even at near grazing incidence without special consideration of refraction or external reflection. It is also easy to apply to problems where periodicity of oblique Bragg planes varies in the direction normal to the surface. Such strain may be induced, for example, by variation of composition with depth. Certain problems wherein simultaneous diffraction by two sets of Bragg planes occurs can also be treated by this approach.

Three-wave grazing-incidence X-ray diffraction from thin crystal surface layers: determination of triplet phase invariants

1999 ◽  
Vol 55 (3) ◽  
pp. 457-465
Author(s):  
Yuri P. Stetsko ◽  
Shih-Lin Chang
Keyword(s):  
Crystal Surface ◽  
Grazing Incidence ◽  
Dynamical Theory ◽  
X Ray Diffraction ◽  
Surface Layers ◽  
X Ray ◽  
Analysis Scheme ◽  
Diffracted Waves ◽  
Spectral Distributions ◽  
Thin Crystal

Numerical calculation of the angular and spectral distributions of the intensities of the specularly diffracted waves in the case of three-wave grazing-incidence X-ray diffraction is carried out using the dynamical theory. The angular and spectral distributions are shown to be uniquely and continuously dependent upon the value of the triplet phase invariant. A method of determining the value of the triplet phase invariant for thin crystal surface layers is developed, based on the comparison of experimentally measured three-wave peak profiles with the profiles calculated for different values of the triplet phase invariant. An analysis scheme of the phase sensitivity of the reflection coefficients is proposed taking into account the interference of the directly excited and the `Umweg'-excited specularly diffracted waves.

Determination of the interface structural morphology from grazing-incidence X-ray diffraction data using dynamical theory

1997 ◽  
Vol 384 (1-3) ◽  
pp. 254-259 ◽  
Author(s):  
Tsai-Sheng Gau ◽  
Hung-Chun Chien ◽  
Shih-Lin Chang ◽  
Mei-Yen Li ◽  
Maw-Kuen Wu
Keyword(s):  
Diffraction Data ◽  
Grazing Incidence ◽  
Dynamical Theory ◽  
X Ray Diffraction ◽  
Structural Morphology ◽  
X Ray

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

scholarly journals Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3191
Author(s):  
Arun Kumar Mukhopadhyay ◽  
Avishek Roy ◽  
Gourab Bhattacharjee ◽  
Sadhan Chandra Das ◽  
Abhijit Majumdar ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Relative Composition ◽  
Transmission Electron ◽  
Deposited Film ◽  
Deposited Films

We report the surface stoichiometry of Tix-CuyNz thin film as a function of film depth. Films are deposited by high power impulse (HiPIMS) and DC magnetron sputtering (DCMS). The composition of Ti, Cu, and N in the deposited film is investigated by X-ray photoelectron spectroscopy (XPS). At a larger depth, the relative composition of Cu and Ti in the film is increased compared to the surface. The amount of adventitious carbon which is present on the film surface strongly decreases with film depth. Deposited films also contain a significant amount of oxygen whose origin is not fully clear. Grazing incidence X-ray diffraction (GIXD) shows a Cu3N phase on the surface, while transmission electron microscopy (TEM) indicates a polycrystalline structure and the presence of a Ti3CuN phase.

Role of water in the surface relaxation of the fluorapatite (100) surface by grazing incidence x-ray diffraction

2007 ◽  
Vol 75 (3) ◽  
Author(s):  
Aparna Pareek ◽  
Xavier Torrelles ◽  
Jordi Rius ◽  
Uta Magdans ◽  
Hermann Gies
Keyword(s):  
Grazing Incidence ◽  
Surface Relaxation ◽  
X Ray Diffraction ◽  
X Ray
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