Surface recombination velocity measurements at the silicon–silicon dioxide interface by microwave‐detected photoconductance decay
1988 ◽
Vol 92
(16)
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pp. 4676-4679
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2010 ◽
Vol 31
(9)
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pp. 1002-1004
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1978 ◽
Vol 21
(7)
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pp. 957-964
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1984 ◽
Vol 27
(1)
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pp. 59-67
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