Computer simulation of electromigration in thin‐film metal conductors

1994 ◽  
Vol 75 (12) ◽  
pp. 7799-7804 ◽  
Author(s):  
J. T. Trattles ◽  
A. G. O’Neill ◽  
B. C. Mecrow
1992 ◽  
Author(s):  
J. Schutkeker ◽  
L. Chen ◽  
F. Wong ◽  
S. Patel ◽  
D. T. Shaw

Vacuum ◽  
2002 ◽  
Vol 67 (2) ◽  
pp. 229-233 ◽  
Author(s):  
R Hrach ◽  
J Šimek ◽  
M Kostern

2004 ◽  
Vol 451-452 ◽  
pp. 402-407 ◽  
Author(s):  
O.Yu. Borkovskaya ◽  
N.L. Dmitruk ◽  
V.G. Lyapin ◽  
A.V. Sachenko

1992 ◽  
Vol 117 (1-4) ◽  
pp. 1012-1015
Author(s):  
Zhang Zhi-Lin ◽  
Zhang Bu-Xin ◽  
Zhao Wei-Ming ◽  
Jiang Xue-Yin ◽  
Liu Zu-Gang

1999 ◽  
Vol 16 (4) ◽  
pp. 279-281 ◽  
Author(s):  
Feng-min Wu ◽  
Qiao-wen Li ◽  
Qi-peng Zhu ◽  
Zi-qin Wu

2003 ◽  
Vol 169-170 ◽  
pp. 215-218 ◽  
Author(s):  
Y. Kaneko ◽  
Y. Hiwatari ◽  
K. Ohara ◽  
T. Murakami

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