Novel measurement method of DC magnetic properties having freedom of specimen shape

2011 ◽  
Vol 109 (7) ◽  
pp. 07A330
Author(s):  
N. Takahashi ◽  
D. Miyagi ◽  
F. Inoue ◽  
M. Nakano
Keyword(s):  
Magnetic Properties ◽  
Measurement Method ◽  
Specimen Shape

Standard Measurement Method for Magnetic Properties of Fe-Based Amorphous Magnetic Materials

2014 ◽  
Vol 50 (4) ◽  
pp. 1-4 ◽  
Author(s):  
Hiroto Hagihara ◽  
Masaya Tanaka ◽  
Yasuhito Takahashi ◽  
Koji Fujiwara ◽  
Yoshiyuki Ishihara
Keyword(s):  
Magnetic Properties ◽  
Magnetic Materials ◽  
Measurement Method ◽  
Standard Measurement ◽  
Amorphous Magnetic Materials

A measurement method of the magnetic properties of magnetic sheet by means of a single sheet tester at audio frequency

2008 ◽  
Vol 320 (20) ◽  
pp. e599-e603
Author(s):  
Yusuke Takara ◽  
Koji Fujiwara ◽  
Yoshiyuki Ishihara ◽  
Toshiyuki Todaka
Keyword(s):  
Magnetic Properties ◽  
Measurement Method ◽  
Audio Frequency ◽  
Single Sheet

AEM analysis of crystallization in Ti-based amorphous alloys

1983 ◽  
Vol 41 ◽  
pp. 270-271
Author(s):  
A.R. Pelton ◽  
A.F. Marshall ◽  
Y.S. Lee
Keyword(s):  
Magnetic Properties ◽  
Amorphous Alloys ◽  
Amorphous Materials ◽  
Isothermal Annealing ◽  
Amorphous Matrix ◽  
Nucleation And Growth ◽  
Current Interest ◽  
Amorphous Films ◽  
Electrical And Magnetic Properties

Amorphous materials are of current interest due to their desirable mechanical, electrical and magnetic properties. Furthermore, crystallizing amorphous alloys provides an avenue for discerning sequential and competitive phases thus allowing access to otherwise inaccessible crystalline structures. Previous studies have shown the benefits of using AEM to determine crystal structures and compositions of partially crystallized alloys. The present paper will discuss the AEM characterization of crystallized Cu-Ti and Ni-Ti amorphous films.Cu60Ti40: The amorphous alloy Cu60Ti40, when continuously heated, forms a simple intermediate, macrocrystalline phase which then transforms to the ordered, equilibrium Cu3Ti2 phase. However, contrary to what one would expect from kinetic considerations, isothermal annealing below the isochronal crystallization temperature results in direct nucleation and growth of Cu3Ti2 from the amorphous matrix.

Microstructure in soft magnetic E3 (S1, Al) (Sendust) alloys

1988 ◽  
Vol 46 ◽  
pp. 770-771
Author(s):  
June D. Kim
Keyword(s):  
Electron Microscopy ◽  
Magnetic Properties ◽  
Ternary Phase Diagram ◽  
Vertical Tube ◽  
Vacuum Induction Melting ◽  
Induction Melting ◽  
Soft Magnetic ◽  
Quenching Temperature ◽  
Thin Foils ◽  
Vertical Tube Furnace

Iron-base alloys containing 8-11 wt.% Si, 4-8 wt.% Al, known as “Sendust” alloys, show excellent soft magnetic properties. These magnetic properties are strongly dependent on heat treatment conditions, especially on the quenching temperature following annealing. But little has been known about the microstructure and the Fe-Si-Al ternary phase diagram has not been established. In the present investigation, transmission electron microscopy (TEM) has been used to study the microstructure in a Sendust alloy as a function of temperature.An Fe-9.34 wt.% Si-5.34 wt.% Al (approximately Fe3Si0.6Al0.4) alloy was prepared by vacuum induction melting, and homogenized at 1,200°C for 5 hrs. Specimens were heat-treated in a vertical tube furnace in air, and the temperature was controlled to an accuracy of ±2°C. Thin foils for TEM observation were prepared by jet polishing using a mixture of perchloric acid 15% and acetic acid 85% at 10V and ∼13°C. Electron microscopy was performed using a Philips EM 301 microscope.

Evaluation method for imaging plate resolution by means of phase contrast transfer function

1995 ◽  
Vol 53 ◽  
pp. 662-663 ◽  
Author(s):  
T. Oikawa ◽  
H. Kosugi ◽  
F. Hosokawa ◽  
D. Shindo ◽  
M. Kersker
Keyword(s):  
Transfer Function ◽  
Phase Contrast ◽  
Evaluation Method ◽  
Amorphous Film ◽  
Imaging Plate ◽  
X Rays ◽  
Special Shape ◽  
Contrast Transfer Function ◽  
Contrast Image ◽  
Specimen Shape

Evaluation of the resolution of the Imaging Plate (IP) has been attempted by some methods. An evaluation method for IP resolution, which is not influenced by hard X-rays at higher accelerating voltages, was proposed previously by the present authors. This method, however, requires truoblesome experimental preperations partly because specially synthesized hematite was used as a specimen, and partly because a special shape of the specimen was used as a standard image. In this paper, a convenient evaluation method which is not infuenced by the specimen shape and image direction, is newly proposed. In this method, phase contrast images of thin amorphous film are used.Several diffraction rings are obtained by the Fourier transformation of a phase contrast image of thin amorphous film, taken at a large under focus. The rings show the spatial-frequency spectrum corresponding to the phase contrast transfer function (PCTF). The envelope function is obtained by connecting the peak intensities of the rings. The evelope function is offten used for evaluation of the instrument, because the function shows the performance of the electron microscope (EM).

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