X‐ray diffraction and x‐ray absorption studies of porous silicon, siloxene, heat‐treated siloxene, and layered polysilane
Keyword(s):
X Ray
◽
1950 ◽
Vol 6
(7)
◽
pp. 267-269
◽
2008 ◽
Vol 10
(11)
◽
pp. 1634-1639
◽
1997 ◽
Vol 7
(C2)
◽
pp. C2-619-C2-620
◽
2019 ◽