High pressure ellipsometry: A novel method for measuring the optical properties and electronic structure of materials in diamond anvil cells
2011 ◽
Vol 82
(3)
◽
pp. 033905
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Keyword(s):
2016 ◽
Vol 672
◽
pp. 419-425
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Keyword(s):
2002 ◽
Vol 58
(s1)
◽
pp. c255-c255
2003 ◽
Vol 235
(2)
◽
pp. 509-513
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Keyword(s):
1987 ◽
Vol 26
(Part 1, No. 12)
◽
pp. 2107-2110
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2013 ◽
Vol 19
(12)
◽
pp. 5159-5170
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2007 ◽
Vol 27
(2)
◽
pp. 235-247
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