Pulse repetition rate up to 92 GHz or pulse duration shorter than 110 fs from a mode-locked semiconductor disk laser

2011 ◽  
Vol 98 (7) ◽  
pp. 071103 ◽  
Author(s):  
P. Klopp ◽  
U. Griebner ◽  
M. Zorn ◽  
M. Weyers
Keyword(s):  
Pulse Duration ◽  
Repetition Rate ◽  
Pulse Repetition Rate ◽  
Pulse Repetition ◽  
Disk Laser ◽  
Semiconductor Disk Laser

scholarly journals Pulse repetition rate scaling from 5 to 100 GHz with a high-power semiconductor disk laser

2014 ◽  
Vol 22 (5) ◽  
pp. 6099 ◽  
Author(s):  
Mario Mangold ◽  
Christian A. Zaugg ◽  
Sandro M. Link ◽  
Matthias Golling ◽  
Bauke W. Tilma ◽  
...  
Keyword(s):  
High Power ◽  
Repetition Rate ◽  
Pulse Repetition Rate ◽  
Pulse Repetition ◽  
Power Semiconductor ◽  
Disk Laser ◽  
Semiconductor Disk Laser

scholarly journals The Influence of the Processing Parameters on the Laser-Ablation of Stainless Steel and Brass during the Engraving by Nanosecond Fiber Laser

Nanomaterials ◽  
2022 ◽  
Vol 12 (2) ◽  
pp. 232
Author(s):  
Luka Hribar ◽  
Peter Gregorčič ◽  
Matej Senegačnik ◽  
Matija Jezeršek
Keyword(s):  
Surface Roughness ◽  
Fiber Laser ◽  
Pulse Duration ◽  
Repetition Rate ◽  
Pulse Repetition Rate ◽  
Removal Rate ◽  
Average Power ◽  
Laser Pulses ◽  
Processing Parameters ◽  
Pulse Repetition

In this paper, we investigate the influence of the following parameters: pulse duration, pulse repetition rate, line-to-line and pulse-to-pulse overlaps, and scanning strategy on the ablation of AISI 316L steel and CuZn37 brass with a nanosecond, 1064-nm, Yb fiber laser. The results show that the material removal rate (MRR) increases monotonically with pulse duration up to the characteristic repetition rate (f0) where pulse energy and average power are maximal. The maximum MRR is reached at a repetition rate that is equal or slightly higher as f0. The exact value depends on the correlation between the fluence of the laser pulses and the pulse repetition rate, as well as on the material properties of the sample. The results show that shielding of the laser beam by plasma and ejected material plays an important role in reducing the MRR. The surface roughness is mainly influenced by the line-to-line and the pulse-to-pulse overlaps, where larger overlap leads to lower roughness. Process optimization indicates that while operating with laser processing parameters resulting in the highest MRR, the best ratio between the MRR and surface roughness appears at ~50% overlap of the laser pulses, regardless of the material being processed.

Pulsed X-ray source with the pulse duration of 50 ns and the peak power of 70 MW for capturing moving objects

2021 ◽  
pp. 1-10
Author(s):  
Alexander Alexandrovich Komarskiy ◽  
Sergey Romanovich Korzhenevskiy ◽  
Andrey Viktorovich Ponomarev ◽  
Nikita Alexandrovich Komarov
Keyword(s):  
Pulse Duration ◽  
Repetition Rate ◽  
Pulse Repetition Rate ◽  
Moving Objects ◽  
Frame Rate ◽  
Pulse Repetition ◽  
Storage Device ◽  
Semiconductor Detectors ◽  
X Rays ◽  
X Ray

BACKGROUND: Traditionally, X-ray systems for capturing moving objects consist of a continuous X-ray source and a detector that operates at a predetermined frame rate. OBJECTIVE: This study investigates the possibility of using pulsed X-ray source with an inductive energy storage device and a semiconductor opening switch for shooting moving objects. METHODS: The study uses a high-voltage pulse generator that has the following parameters namely, the pulse voltage amplitude up to 320 kV, the pulse current up to 240 A, the current pulse duration of about 50 ns, and the pulse repetition rate up to 2 kHz. The duration and intensity of glow for standard CsI:Tl and Gd2O2S:Tb X-ray phosphors after their irradiation with X-ray flashes of about 50 ns duration are investigated. After X-ray radiation is converted into light, the signal is recorded using semiconductor detectors. We acquired several images of an object moving at a speed of about 20 m/s. A semiconductor detector with phosphor, which operates in the mode of continuous signal accumulation, is used. RESULTS: When using the pulsed X-ray source and phosphors with a short afterglow, the individual frames can be obtained at the pulse repetition rate of several kilohertz, and the detector does not contain the residual luminescence from the previous frame by the arrival of the next frame. CONCLUSIONS: The X-ray source shows good pulse-to-pulse reproducibility of X-rays, and can be used to capture objects in motion at a frame rate of several kHz.

scholarly journals Adaptive Nonlinear Phase Compensation in a Femtosecond Hybrid Laser with Varying Pulse Repetition Rate

Photonics ◽  
2021 ◽  
Vol 8 (9) ◽  
pp. 387
Author(s):  
Luka Černe ◽  
Jaka Petelin ◽  
Rok Petkovšek
Keyword(s):  
Solid State ◽  
Laser Pulse ◽  
Pulse Duration ◽  
Pulse Energy ◽  
Repetition Rate ◽  
Pulse Repetition Rate ◽  
Pulse Repetition ◽  
Strehl Ratio ◽  
Pulse Parameters ◽  
Nonlinear Phase

In this manuscript, an implementation of a tunable nonlinear phase compensation method is demonstrated on a typical femtosecond hybrid laser consisting of a fiber pre-amplifier and an additional solid-state amplifier. This enables one to achieve constant laser pulse parameters over a wide range of pulse repetition rates in such a laser. As the gain in the solid-state amplifier is inversely proportional to the input power, the shortfall in the solid-state gain at higher repetition rates must be compensated for with fiber pre-amplifier to ensure constant pulse energy. This increases the accumulated nonlinear phase and consequently alters the laser pulse parameters such as pulse duration and Strehl ratio. To overcome this issue, the nonlinear phase must be compensated for, and what is more it should be compensated for to a different extent at different pulse repetition rates. This is achieved with a tunable CFBG, used also as a pulse stretcher. Using this concept, we demonstrate that constant laser pulse parameters such as pulse energy, pulse duration and Strehl ratio can be achieved in a hybrid laser regardless of the pulse repetition rate.

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