Method for thermal diffusivity measurements based on photothermal deflection

1993 ◽  
Vol 74 (12) ◽  
pp. 7078-7084 ◽  
Author(s):  
M. Bertolotti ◽  
G. Liakhou ◽  
R. Li Voti ◽  
F. Michelotti ◽  
C. Sibilia
Keyword(s):  
Thermal Diffusivity ◽  
Diffusivity Measurements ◽  
Photothermal Deflection

Thermal diffusivity measurements of semiconducting amorphous Ge Se100− thin films by photothermal deflection technique

2004 ◽  
Vol 227 (1-4) ◽  
pp. 410-415 ◽  
Author(s):  
Alex Mathew ◽  
Jyotsna Ravi ◽  
K.N. Madhusoodanan ◽  
K.P.R. Nair ◽  
T.M.A. Rasheed
Keyword(s):  
Thin Films ◽  
Thermal Diffusivity ◽  
Diffusivity Measurements ◽  
Photothermal Deflection

Photothermal deflection applied to thermal diffusivity measurements of ceramic (ferrite) materials

1988 ◽  
Vol 21 (10S) ◽  
pp. S14-S16 ◽  
Author(s):  
M Bertolotti ◽  
L Fabbri ◽  
C Sibilia ◽  
A Ferrari ◽  
N Sparvieri ◽  
...  
Keyword(s):  
Thermal Diffusivity ◽  
Diffusivity Measurements ◽  
Photothermal Deflection

INTERFEROMETRIC MEASUREMENTES OF PHOTOTHERMAL DEFLECTION

2001 ◽  
Vol 15 (17n19) ◽  
pp. 613-616 ◽  
Author(s):  
E. CORONA-ORGANICHE ◽  
E. LOPEZ-CRUZ
Keyword(s):  
Thermal Diffusivity ◽  
Semiconductor Materials ◽  
Dimensional Model ◽  
Thick Sample ◽  
One Dimensional ◽  
Photothermal Technique ◽  
Diffusivity Measurements ◽  
Photothermal Deflection

The photothermal technique has been applied for the thermal diffusivity measurements. These measurements based on interferometric photothermal deflection effect were made on ZnxCd1-x Te (x = 5%, 10% and 20%). A simple one-dimensional model is presented to obtain the thermal diffusivity for semiconductor materials in the case of a thermally thick sample that is optically opaque.

Sign in / Sign up

Export Citation Format

Share Document