Grain boundary assisted degradation and breakdown study in cerium oxide gate dielectric using scanning tunneling microscopy

2011 ◽  
Vol 98 (7) ◽  
pp. 072902 ◽  
Author(s):  
K. Shubhakar ◽  
K. L. Pey ◽  
S. S. Kushvaha ◽  
S. J. O’Shea ◽  
N. Raghavan ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Scanning Tunneling Microscopy ◽  
Cerium Oxide ◽  
Gate Dielectric ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

scholarly journals Study of Trap Generation in the Sc2O3/La2O3/SiOx Gate Dielectric Stack by Scanning Tunneling Microscopy

2011 ◽  
Vol 54 (7/8) ◽  
pp. 427-436
Author(s):  
Yi Ching ONG ◽  
Diing Shenp ANG ◽  
Sean Joseph O'SHEA ◽  
Kin Leong PEY ◽  
Kuniyuki KAKUSHIMA ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Gate Dielectric ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Grain boundary passivation studied by in situ scanning tunneling microscopy on microcrystalline copper

2015 ◽  
Vol 19 (12) ◽  
pp. 3501-3509 ◽  
Author(s):  
Hu Chen ◽  
Vincent Maurice ◽  
Lorena H. Klein ◽  
Linsey Lapeire ◽  
Kim Verbeken ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Bilayer gate dielectric study by scanning tunneling microscopy

2007 ◽  
Vol 91 (10) ◽  
pp. 102905 ◽  
Author(s):  
Y. C. Ong ◽  
D. S. Ang ◽  
K. L. Pey ◽  
S. J. O’Shea ◽  
K. E. J. Goh ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Gate Dielectric ◽  
Scanning Tunneling ◽  
Dielectric Study ◽  
Tunneling Microscopy

Study of trap generation in the Sc2O3/La2O3/SiOx gate dielectric stack by scanning tunneling microscopy

2008 ◽  
Vol 93 (24) ◽  
pp. 242904 ◽  
Author(s):  
D. S. Ang ◽  
Y. C. Ong ◽  
S. J. O’Shea ◽  
K. L. Pey ◽  
K. Kakushima ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Gate Dielectric ◽  
Scanning Tunneling ◽  
Tunneling Microscopy
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