Vibrational mode and dielectric function spectra of BGaP probed by Raman scattering and spectroscopic ellipsometry

2011 ◽  
Vol 109 (5) ◽  
pp. 053504 ◽  
Author(s):  
S. Rogowsky ◽  
M. Baeumler ◽  
M. Wolfer ◽  
L. Kirste ◽  
R. Ostendorf ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Vibrational Mode

Non Destructive Optical Analysis of Implanted Layers in GaAs by Raman Scattering and Spectroscopic Ellipsometry

1982 ◽  
Vol 14 ◽  
Author(s):  
Joseph Biellmann ◽  
Bernard Prevot ◽  
Claude Schwab ◽  
Jean-Bernard Theeten ◽  
Marko Erman
Keyword(s):  
Raman Scattering ◽  
Dielectric Function ◽  
Imaginary Part ◽  
Depth Profile ◽  
Spectroscopic Ellipsometry ◽  
Intensity Ratio ◽  
Optical Analysis ◽  
Lattice Potential ◽  
Destructive Analysis ◽  
Non Destructive

ABSTRACTNon destructive analysis by Raman Scattering (RS) and Spectroscopic Ellipsometry (SE) is demonstrated on B+- and Se+ shallow implanted GaAs. Qualitative informations are obtained from 1st and 2nd order RS spectra. The former are analysed using the intensity ratio of the T0 and L0 modes, which defines a lattice potential perfection scale. The SE analysis of the E1, E1 +Δ1 structure in the imaginary part of the dielectric function confirms the RS results and its multilayer analysis yields the depth profile of the implanted ions.

Dielectric function of thin polypyrrole and Prussian blue films by spectroscopic ellipsometry

1983 ◽  
Vol 6 ◽  
pp. 309-316 ◽  
Author(s):  
H. Arwin ◽  
D.E. Aspnes ◽  
R. Bjorklund ◽  
I. Lundström
Keyword(s):  
Prussian Blue ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry

Dielectric function of ZnTe nanocrystals by spectroscopic ellipsometry

2009 ◽  
Vol 20 (30) ◽  
pp. 305702 ◽  
Author(s):  
F Ahmed ◽  
A En Naciri ◽  
J J Grob ◽  
M Stchakovsky ◽  
L Johann
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry

Measurement of the dielectric function spectra of low dielectric constant using the spectroscopic ellipsometry

2003 ◽  
Author(s):  
Masahiro Horie ◽  
Kamil Postava ◽  
Tomuo Yamaguchi ◽  
Kumiko Akashika ◽  
Hideki Hayashi ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Low Dielectric Constant ◽  
Low Dielectric

Near-field scanning optical microscopy incorporating Raman scattering for vibrational mode contrast

1999 ◽  
Vol 433-435 ◽  
pp. 48-52 ◽  
Author(s):  
Claire E. Jordan ◽  
Stephan J. Stranick ◽  
Richard R. Cavanagh ◽  
Lee J. Richter ◽  
D.Bruce Chase
Keyword(s):  
Raman Scattering ◽  
Optical Microscopy ◽  
Vibrational Mode ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Dielectric function and magneto-optical Voigt constant of Cu2O: A combined spectroscopic ellipsometry and polar magneto-optical Kerr spectroscopy study

2011 ◽  
Vol 84 (19) ◽  
Author(s):  
Francisc Haidu ◽  
Michael Fronk ◽  
Ovidiu D. Gordan ◽  
Camelia Scarlat ◽  
Georgeta Salvan ◽  
...  
Keyword(s):  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Spectroscopy Study

STUDIES OF NEW SUPERCONDUCTING Bi-Sr-Ca-Cu-O SYSTEM BY INFRARED AND RAMAN SPECTROSCOPY

1988 ◽  
Vol 02 (05) ◽  
pp. 707-711 ◽  
Author(s):  
JINGQING LIU ◽  
YIFENG YAN ◽  
TANG ZHOU ◽  
GUANGCAN CHE ◽  
DAWEI CHANG ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Absorption Band ◽  
Infrared Spectrum ◽  
Raman Scattering ◽  
Vibrational Mode ◽  
Raman Scattering Spectrum ◽  
Infrared Transmission ◽  
Phonon Modes ◽  
Scattering Spectrum ◽  
Infrared And Raman Spectroscopy

We report both infrared transmission and Raman scattering results on the new superconducting Bi-Sr-Ca-Cu-O system. Because of its layered structure along c axis, some very thin and transparent slices have been got. In the infrared spectrum there is an absorption band around 500cm−1 with a width of about 300cm−1, and a vibrational mode at 840cm−1, higher frequency than those of phonon modes in Y-Ba-Cu-O system, has also been observed. The Raman scattering spectrum shows similar results, but the scattering signals are very weak because of the strong absorption in visible of this system.

Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry

2001 ◽  
Vol 693 ◽  
Author(s):  
N.V. Edwards ◽  
O.P.A. Lindquist ◽  
L.D. Madsen ◽  
S. Zollner ◽  
K. Järrehdahl ◽  
...  
Keyword(s):  
Optical Properties ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Vacuum Ultraviolet ◽  
Critical Assessment ◽  
Optical Transitions ◽  
Common Substrate ◽  
Materials Used

AbstractAs a first step toward enabling the in-line metrology of III-V nitride heterostructure and materials, we present the optical constants of the two common substrate materials over an unprecendented spectral range. Vacuum Ultraviolet spectroscopic ellipsometry (VUVSE) was used to obtain the optical constants for Al2O3 and the ordinary and extra-ordinary component of the dielectric function for both 4H- and 6H-SiC. The results are discussed in the context of anisotropy, polytypism, bandstructure, optical transitions, and preparation/characterization of abrupt surfaces, where appropriate.

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