Dielectric polarization relaxation measurement in α‐SiO2by means of a scanning electron microscope technique

1993 ◽  
Vol 74 (2) ◽  
pp. 1250-1255 ◽  
Author(s):  
K. H. Oh ◽  
C. Le Gressus ◽  
H. Gong ◽  
C. K. Ong ◽  
B. T. G. Tan ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Relaxation Measurement ◽  
Dielectric Polarization ◽  
Microscope Technique ◽  
Scanning Electron

An Inverse Relation Between Cell Density and the Number of Microvilli in Cultures of BHK 21 Hamster Fibroblasts

1970 ◽  
Vol 7 (3) ◽  
pp. 695-709
Author(s):  
C. H. O'NEILL ◽  
E. A. C. FOLLETT
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Monolayer Culture ◽  
Cell Contact ◽  
Inverse Relation ◽  
Culture Density ◽  
Microscope Technique ◽  
The Relationship ◽  
Number Of Cells ◽  
Scanning Electron

The relationship between culture density and the number of microvilli on the cell surface has been studied using BHK21 cells in established monolayer culture. The number of microvilli can be estimated quantitatively by a scanning electron-microscope technique. It can be increased by applying specific antiserum, but whether antibody is applied or not a significant number of cells regularly bear microvilli. This number is characteristic of the culture density. In sparse cultures above a certain minimum density it is relatively high, and in confluent cultures it is much reduced. These results indicate that microvilli may be inhibited by cell contact.

A Simple Light-Microscope Technique for the Examination of Cell Surfaces

1973 ◽  
Vol 13 (1) ◽  
pp. 317-319
Author(s):  
A. ROSS ◽  
I. P. GORMLEY
Keyword(s):  
Heavy Metal ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Light Microscope ◽  
Simple Technique ◽  
Cell Surfaces ◽  
Microscope Technique ◽  
Scanning Electron

A simple technique for the examination of cell surfaces by shadowing them with a heavy metal and examining by light microscopy has been described. Stained preparations can be examined and photographed initially prior to investigation by this technique. It is suggested that this technique could be used instead of the scanning electron microscope or replica techniques where the limited resolution of the light microscope is sufficient.

A scanning electron microscope technique for studying the sclerites of Cichlidogyrus

2015 ◽  
Vol 114 (5) ◽  
pp. 2031-2034 ◽  
Author(s):  
Wouter Fannes ◽  
Maarten P. M. Vanhove ◽  
Tine Huyse ◽  
Giuseppe Paladini
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Microscope Technique ◽  
Scanning Electron
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