Photoabsorption and photoelectric process in Si nanocrystallites

2011 ◽  
Vol 98 (4) ◽  
pp. 043106 ◽  
Author(s):  
Anchala ◽  
S. P. Purohit ◽  
K. C. Mathur
Keyword(s):  
2010 ◽  
Vol 247 (8) ◽  
pp. 2113-2117 ◽  
Author(s):  
Roberto Guerra ◽  
Elena Degoli ◽  
Margherita Marsili ◽  
Olivia Pulci ◽  
Stefano Ossicini

2007 ◽  
Vol 124-126 ◽  
pp. 1261-1264 ◽  
Author(s):  
Jae Hyun Shim ◽  
Nam Hee Cho

Amorphous and nanocrystalline Si films were prepared by plasma enhanced chemical vapor deposition (PECVD). The films were deposited with a RF power of 100 W, while substrates were under DC biases varying from 0 to -600 V. The size as well as the concentration of Si nanocrystallites increased with raising the DC bias; the PL emission wavelength was shifted from 400 to 750 nm. A model for the nanostructural variation in the nc-Si:H films was suggested to describe the change in the size and concentration of the nanocrystallites as well as the amorphous matrix depending on the DC bias conditions.


1998 ◽  
Vol 83 (4) ◽  
pp. 2228-2234 ◽  
Author(s):  
T. Inokuma ◽  
Y. Wakayama ◽  
T. Muramoto ◽  
R. Aoki ◽  
Y. Kurata ◽  
...  

2006 ◽  
Vol 84 (4) ◽  
pp. 395-401 ◽  
Author(s):  
N. Fukata ◽  
C. Li ◽  
H. Morihiro ◽  
K. Murakami ◽  
M. Mitome ◽  
...  

2012 ◽  
Vol 687 ◽  
pp. 84-88 ◽  
Author(s):  
Minsoo Kim ◽  
Jae-Woong Kim ◽  
Min-Seok Sung ◽  
Yoon Hwa ◽  
Seong Hoon Kim ◽  
...  

2004 ◽  
Vol 832 ◽  
Author(s):  
N. Fukata ◽  
C. Li ◽  
H. Uematsu ◽  
T. Arai ◽  
T. Makimura ◽  
...  

ABSTRACTHydrogen passivation effect on the enhancement of photoluminescence (PL) of Er ions in SiO2 films contained Si nanocrystallites (nc-Si) has been investigated. Er-doped SiO2 films were fabricated by laser ablation of Er-deposited Si substrate in oxygen gas atmosphere. The PL intensity of Er ions and nc-Si were increased by hydrogen gas treatments, while ESR signal intensity of residual defects located at the interfaces between nc-Si and SiO2 was decreased. These results indicate that hydrogen passivation of residual defects is useful for the enhancement of the Er PL.


2003 ◽  
Vol 23 (6-8) ◽  
pp. 1017-1019 ◽  
Author(s):  
Kyung Ah Jeon ◽  
Jong Hoon Kim ◽  
Jin Baek Choi ◽  
Kyoung Bo Han ◽  
Sang Yeol Lee

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