X‐ray analysis of compositional modulation in Co/Pt multilayer films for magneto‐optic recording

1993 ◽  
Vol 74 (2) ◽  
pp. 996-1000 ◽  
Author(s):  
J. A. Bain ◽  
B. M. Clemens ◽  
H. Notarys ◽  
E. E. Marinero ◽  
S. Brennan
Keyword(s):  
Multilayer Films ◽  
X Ray ◽  
Compositional Modulation ◽  
Magneto Optic

X-ray scattering topography of metallic multilayer films

1993 ◽  
Vol 126 (1-3) ◽  
pp. 34-37
Author(s):  
T. Shinozaki ◽  
T. Hondoh ◽  
A. Goto ◽  
A. Takahashi ◽  
T. Takama ◽  
...  
Keyword(s):  
Multilayer Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Structural Properties Of Co/Re Superlattices

1991 ◽  
Vol 238 ◽  
Author(s):  
Y. Huai ◽  
R. W. Cochrane ◽  
Y. Shi ◽  
H. E. Fischer ◽  
M. Sutton
Keyword(s):  
Structural Disorder ◽  
Multilayer Films ◽  
Film Plane ◽  
X Ray Diffraction ◽  
X Ray ◽  
Bilayer Films ◽  
Out Of Plane ◽  
Reflectivity Data ◽  
Sharp Interfaces ◽  
Good Agreement

ABSTRACTThe structures of equal-thickness Co/Re multilayer films and several Co/Re bilayer films have been investigated by X-ray diffraction at low and high angles. Analysis of low-angle reflectivity data from bilayer films indicates that interfacial intermixing is limited to three monolayers and that the two interfacial configurations are different. The high-angle X-ray diffraction data show that multilayer films have coherent interfaces and a highly textured structure with hep [002] orientations normal to the film plane for periods 21 Å ≤ Λ ≤220 Å. Detailed structures have been determined by fitting the X-ray spectra to calculated ones using a trapezoidal model. The results indicate that samples with 42 Å≤ Λ ≤220 Å have relatively sharp interfaces, in good agreement with the bilayer results. In addition, an out-of-plane expansion of the Co (002) layer is observed in samples with large Λ and results from structural disorder leading to a reduced atomic density. For Λ <21 Å the interfaces arise from the rougher surfaces of the deposited layers.

Compositional Modulation and its Optoelectric Properties of Zn(S,Se,Te) Crystals Grown by Hydrogen Radical-Enhanced CVD

1995 ◽  
Vol 417 ◽  
Author(s):  
Hiroyuki Fujiwara ◽  
Toshihiro Ii ◽  
Isamu Shimizu
Keyword(s):  
Deep Level ◽  
Chemical Vapor ◽  
X Ray Diffraction ◽  
Small Shift ◽  
X Ray ◽  
Compositional Modulation ◽  
Peak Energy ◽  
Large Lattice ◽  
The Difference ◽  
Hydrogen Radical

AbstractHigh-quality (ZnS)n(ZnSe)12n and (ZnSe)n(ZnTe)11n (n=1∼4) crystals were grown at a low temperature of 200°C by hydrogen radical-enhanced chemical vapor deposition. From satellite peaks in x-ray diffraction spectra, these periodic structure crystals were confirmed to be grown coherently on substrates, in spite of large lattice mismatches between the grown layers and the substrates (͛=4∼7%). In photoluminescence (PL) spectra of these films, strong band-edge emissions were predominantly observed, resulting from a suppression of deep-level emissions. We found that the PL peak energy of (ZnSe)n(ZnTe)11n shifts systematically to lower energy by 200 meV with changes in the number of ZnSe layers (n), while relatively small shift of 13 meV was observed in (ZnS)n(ZnSe)12n. These discrepancy can be attributed to the difference of band-lineups or chemical natures of constituent atoms in these crystals.

THE GIANT MAGNETOSTRICTION OF [Fe/Tb/Fe/Dy]n MULTILAYER FILMS UNDER DIFFERENT ANNEALING TEMPERATURE

2009 ◽  
Vol 16 (01) ◽  
pp. 123-126 ◽  
Author(s):  
X. D. LI ◽  
Z. J. ZHAO ◽  
T. FENG ◽  
L. K. PAN ◽  
S. M. HUANG ◽  
...  
Keyword(s):  
Saturation Magnetization ◽  
Annealing Temperature ◽  
Multilayer Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Low Field ◽  
Giant Magnetostriction

The effect of annealing temperature on the magnetic and giant magnetostriction (GMS) of [ Fe / Tb / Fe / Dy ]n multilayer films were investigated. X-ray diffraction showed that the multilayer films' microstructures were still in amorphous at annealing temperature 300°C. The multilayer films began to crystalline at annealing temperature 400°C. The saturation magnetization of multilayer films increased by the increasing annealed temperature. The coercivity first decreased at annealing temperature 300°C and then increased when the annealing temperature was higher than 400°C. The multilayer films had good low-field GMS, and the magnetostriction of the multilayer films increased by the increasing annealing temperature.

X-ray investigations of Langmuir-Blodgett multilayer films of side-chain liquid crystal copolymers

1994 ◽  
Vol 16 (5) ◽  
pp. 869-875 ◽  
Author(s):  
R. Geer ◽  
S. Qadri ◽  
R. Shashidhar ◽  
A. F. Thibodeaux ◽  
R. S. Duran
Keyword(s):  
Liquid Crystal ◽  
Multilayer Films ◽  
Side Chain ◽  
X Ray ◽  
Langmuir Blodgett

Self-Assembly of Inorganic/Organic Multilayer Films

1994 ◽  
Vol 351 ◽  
Author(s):  
Astrid C. Zeppenfeld ◽  
Catherine J. Page
Keyword(s):  
Self Assembly ◽  
Grazing Angle ◽  
Multilayer Films ◽  
Silicon Wafers ◽  
Initial Surface ◽  
X Ray Diffraction ◽  
Individual Layer ◽  
X Ray ◽  
Influence Of Substrate ◽  
The Individual

ABSTRACTIn order to investigate the influence of substrate functionalization on the subsequent selfassembly of multilayer films, multilayers composed of alternating hafnium and 1,10-decanediylbis(phosphonic) acid (DBPA) have been grown on three different substrates. Substrates studied include gold wafers functionalized with 4-mercaptobutylphosphonic acid, silicon wafers functionalized using a hafnium oxychloride solution, and silicon wafers coated with an octadecylphosphonate LB-template layer. The nature of these films is probed using ellipsometry and grazing angle x-ray diffraction. These studies indicate that the overall order and the individual layer thickness can vary substantially from sample to sample and depend strongly on the initial surface functionalization prior to multilayer growth.

Compositional modulation in InxGa1−xN: TEM and X-ray studies

Microscopy ◽  
2005 ◽  
Vol 54 (3) ◽  
pp. 243-250 ◽  
Author(s):  
Zuzanna Liliental-Weber ◽  
Dmitri N. Zakharov ◽  
Kin M. Yu ◽  
Joel W. Ager ◽  
Wladyslaw Walukiewicz ◽  
...  
Keyword(s):  
X Ray ◽  
Compositional Modulation

Interfacial Composition and Structure in Pt/Ni and Pt/Nb Multilayer Films

1990 ◽  
Vol 187 ◽  
Author(s):  
J.A. Bain ◽  
B.M. Clemens ◽  
S. Brennan
Keyword(s):  
Lattice Spacing ◽  
Grazing Incidence ◽  
Multilayer Films ◽  
Interfacial Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Composition And Structure ◽  
Interfacial Composition ◽  
Alloying Effects ◽  
Coherent Interfaces

AbstractThe interfacial structure of Pt/Nb and Pt/Ni sputtered multilayer films was studied using x-ray diffraction in symmetric, asymmetric, and grazing incidence modes. The grazing incidence and asymmetric diffraction were used to distinguish alloying effects on the lattice spacing from strain in the films. This strain was shown to be consistent with semi-coherent interfaces in the Pt/Ni but not in the Pt/Nb in which another strain generating mechanism dominates.

scholarly journals Comparative X-ray Standing Wave Analysis of Metal−Phosphonate Multilayer Films of Dodecane and Porphyrin Molecular Square

2005 ◽  
Vol 109 (4) ◽  
pp. 1441-1450 ◽  
Author(s):  
Joseph A. Libera ◽  
Richard W. Gurney ◽  
Craig Schwartz ◽  
Hua Jin ◽  
Tien-Lin Lee ◽  
...  
Keyword(s):  
Standing Wave ◽  
Multilayer Films ◽  
Wave Analysis ◽  
X Ray ◽  
Metal Phosphonate ◽  
Molecular Square

Study on quasiperiodic Ta/Al multilayer films by x‐ray diffraction

1991 ◽  
Vol 59 (20) ◽  
pp. 2512-2514 ◽  
Author(s):  
R. W. Peng ◽  
A. Hu ◽  
S. S. Jiang
Keyword(s):  
Multilayer Films ◽  
X Ray Diffraction ◽  
X Ray
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