Hot‐stage transmission electron microscopy studies of phase transformations in tin‐modified lead zirconate titanate

1993 ◽  
Vol 74 (5) ◽  
pp. 3406-3413 ◽  
Author(s):  
Z. Xu ◽  
D. Viehland ◽  
P. Yang ◽  
D. A. Payne
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Phase Transformations ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Zirconate Titanate ◽  
Transmission Electron

X-ray diffraction and high-resolution transmission electron microscopy study on A-site ordering of lanthanum-modified lead zirconate titanate relaxor

1995 ◽  
Vol 10 (7) ◽  
pp. 1582-1584 ◽  
Author(s):  
Fei Fang ◽  
Xiaowen Zhang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Lead Zirconate Titanate ◽  
Microscopy Study ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate ◽  
Transmission Electron

The ordering behavior of La-modified lead zirconate titanate relaxor (PLZT 9/65/35) was investigated by use of an x-ray diffractometer (XRD) and high-resolution transmission electron microscopy (HRTEM). It was shown that a {h + 1/2, k + 1/2, 0}-type superlattice exists both in the x-ray diffraction pattern and selected area electron diffraction (SAED) image. High-resolution electron micrographs further demonstrated the existence of the superlattice and exposed the ordered and disordered regions in the lattice level. A model referring to an A-site body-centered pseudo-cubic superstructure was proposed.

Effects of Additives on Semiconduction Transformation in Lead Zirconate Titanate Ceramic Induced by Atomic Hydrogen

2012 ◽  
Vol 567 ◽  
pp. 162-165 ◽  
Author(s):  
Li Bin Mo ◽  
Sen Chen ◽  
Dong Guo ◽  
Jiang Li Cao
Keyword(s):  
Electron Microscopy ◽  
Lead Zirconate Titanate ◽  
Atomic Hydrogen ◽  
Xrd Analysis ◽  
Lead Zirconate ◽  
Hydrogen Charging ◽  
Charging Time ◽  
Zirconate Titanate ◽  
Transmission Electron ◽  
Surface Structure Change

Effects of additives on the semiconduction transformation of lead zirconate titanate (PZT) during atomic hydrogen charging were investigated. The results showed that the resistivity of the samples decreased by seven orders of magnitude with sixty hours of hydrogen charging in electrolytic without additives. Then with further increasing hydrogen charging time, the resistivity decreased continually, however, much more slowly. Scanning electron microscopy (SEM) showed that the surface structures of PZT were changed significantly upon atomic hydrogen charging. Sodium pyrophosphate (Na4P2O7) and Na2EDTA could effectively affect the semiconduction transformation of PZT as well as the surface structure change. Transmission electron microscopy (TEM) and XRD analysis indicated that there was no new substance formed on the surface of PZT upon atomic hydrogen charging.

scholarly journals In situ Transmission Electron Microscopy Studies of Electric-field-induced Phenomena in Ferroelectrics

2005 ◽  
Vol 20 (7) ◽  
pp. 1641-1653 ◽  
Author(s):  
Xiaoli Tan ◽  
Hui He ◽  
Jian-Ku Shang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Domain Wall ◽  
Electric Field ◽  
Single Crystal ◽  
Electric Fields ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
Transmission Electron ◽  
High Electric Fields

High electric fields were delivered to specimens during imaging in the transmission electron microscopy (TEM) chamber to reveal details of electric field-induced phenomena in ferroelectric oxides. These include the polarization switching in nanometer-sized ferroelectric domains and the grain boundary cavitation in a commercial lead zirconate titanate (PZT) polycrystalline ceramic, the domain wall fracture in a Pb(Mg1/3Nb2/3)O3–PbTiO3 single crystal, and the transformation of incommensurate modulations in Pb0.99Nb0.02[(Zr1−xSnx)1−yTiy]0.98O3 (PZST100x/100y/2) polycrystalline ceramics. In the PZT ceramic, a cavitation process was uncovered for the electric field-induced intergranular fracture. In the ferroelectric single crystal, a preexisting crack was observed to deflect and to follow a 90° domain wall, indicating the presence of severe incompatible piezoelectric strains at thedomain wall. In the antiferroelectric PZST ceramics, the electric field-induced antiferroelectric-to-ferroelectric phase transformation was accompanied with the disappearance of incommensurate modulations.

Interfacial precipitation in titania-doped diphasic mullite gels

1998 ◽  
Vol 13 (4) ◽  
pp. 974-978 ◽  
Author(s):  
Seong-Hyeon Hong ◽  
Naesung Lee ◽  
Altaf H. Carim ◽  
Gary L. Messing
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Phase Transformations ◽  
Orientation Relationship ◽  
Sol Gel ◽  
Sintered Body ◽  
Transmission Electron

Interfacial precipitation in sol-gel derived, titania-doped diphasic mullite gels was investigated using conventional and high resolution transmission electron microscopy. Rutile, anatase, and brookite precipitated on the interface between {110} planes of mullite and glass pockets in the sintered body. The formation of brookite may be attributable to the Si- and Al-rich environment during precipitation. Each polymorph of titania has a unique morphology and orientation relationship with mullite. Brookite exhibits a truncated pill box shape, and anatase displays a vermicular morphology. Quenching experiments suggest that the precipitates grow and undergo phase transformations during cooling.

Intermetallic Formation in PZT for MEMS Structures

2012 ◽  
Vol 1427 ◽  
Author(s):  
Kanu priya Sharma ◽  
Thomas Oseroff ◽  
Leda Lunardi
Keyword(s):  
Electron Microscopy ◽  
Lead Zirconate Titanate ◽  
Surface Film ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Mems Devices ◽  
Aging Effects ◽  
Force Microscopy ◽  
Transmission Electron ◽  
Pzt Films

ABSTRACTCrack free lead zirconate titanate (PZT) films for piezoelectric based MEMS devices have been prepared by a multiple coating sol gel process on platinized silicon (100) substrates. Rapid thermal annealing and Conventional furnace annealing were used for densification and crystallization of the amorphous PZT films. Scanning electron microscopy (SEM), Transmission electron microscopy (TEM) and Atomic force microscopy (AFM) were used to observe surface film morphology and grain growth. The phase content of the films was analyzed using X-ray diffraction. The role of intermetallics formed during the heat treatment in the growth of different orientations has also been observed. Film aging critical for device performance has been observed and methods to revert aging effects have been examined and discussed.

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