Radiation damage in SiO2/Si induced by low‐energy electrons via plasmon excitation
2013 ◽
Vol 4
(5)
◽
pp. 820-825
◽
Keyword(s):
2014 ◽
Vol 16
(29)
◽
pp. 15319-15325
◽
Keyword(s):
1988 ◽
Vol 46
◽
pp. 666-667
Keyword(s):