A high-vacuum deposition system for in situ and real-time electrical characterization of organic thin-film transistors

2011 ◽  
Vol 82 (2) ◽  
pp. 025110 ◽  
Author(s):  
Santiago David Quiroga ◽  
Arian Shehu ◽  
Cristiano Albonetti ◽  
Mauro Murgia ◽  
Pablo Stoliar ◽  
...  
Keyword(s):  
Thin Film ◽  
Real Time ◽  
Thin Film Transistors ◽  
High Vacuum ◽  
Electrical Characterization ◽  
Organic Thin Film Transistors ◽  
Organic Thin Film ◽  
Vacuum Deposition

Real-time monitoring of trap dynamics reveals the electronic states that limit charge transport in crystalline organic semiconductors

2020 ◽  
Vol 7 (9) ◽  
pp. 2390-2398
Author(s):  
Hamna F. Iqbal ◽  
Emma K. Holland ◽  
John E. Anthony ◽  
Oana D. Jurchescu
Keyword(s):  
Thin Film ◽  
Charge Transport ◽  
Real Time ◽  
Organic Semiconductors ◽  
Thin Film Transistors ◽  
Electronic States ◽  
Organic Thin Film Transistors ◽  
Organic Thin Film ◽  
Real Time Monitoring

Access to the dynamics of trap annihilation/generation resulting from isomer rearrangement identifies the performance-limiting processes in organic thin-film transistors.

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