Electron excitation of the Schumann–Runge continuum, longest band, and second band electronic states in O2

Daisuke Suzuki; Hidetoshi Kato; Mizuha Ohkawa; Kazutoshi Anzai; Hiroshi Tanaka; Paulo Limão-Vieira; Laurence Campbell; Michael J. Brunger

doi:10.1063/1.3533442

The and band systems of the CS2+ ion

Canadian Journal of Physics ◽

10.1139/p76-235 ◽

1976 ◽

Vol 54 (19) ◽

pp. 1969-1978 ◽

Cited By ~ 62

Author(s):

Walter J. Balfour

Keyword(s):

Bond Length ◽

Electronic States ◽

Electron Excitation ◽

Fermi Resonance ◽

A Value ◽

Medium Resolution ◽

Resonance Interactions

The [Formula: see text] and [Formula: see text] emission systems of the CS2+ ion have been photographed at medium resolution following controlled electron excitation of CS2 gas. Vibrational analyses have been performed for both systems. The (0010)–(0010) transitions of the [Formula: see text] and [Formula: see text] subsystems lie at 21 107 and 20 843 cm−1, respectively. Evidence is presented for Fermi resonance interactions between (100) and (020) levels in the [Formula: see text] and [Formula: see text] electronic states. The rotational structures of six partially resolved subbands of the [Formula: see text] system have been studied and a value of 1.615 Å obtained for the C—S bond length of CS2+ in the [Formula: see text] state.

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Electron excitation of electronic states of the CO molecule

Physical Review A ◽

10.1103/physreva.9.1954 ◽

1974 ◽

Vol 9 (5) ◽

pp. 1954-1964 ◽

Cited By ~ 52

Author(s):

Sunggi Chung ◽

Chun C. Lin

Keyword(s):

Electronic States ◽

Electron Excitation

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Influence of X-Ray Induced Fluorescence on Energy Dispersive X-Ray Analysis of Thin Foils

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100079164 ◽

1977 ◽

Vol 35 ◽

pp. 328-329

Author(s):

E. A. Kenik ◽

J. Bentley

Keyword(s):

Thin Foil ◽

Electron Excitation ◽

Simple Approach ◽

Foil Thickness ◽

X Rays ◽

X Ray ◽

Hole Spectrum ◽

Illumination System ◽

Thin Foils ◽

Intensity Ratios

Cliff and Lorimer (1) have proposed a simple approach to thin foil x-ray analy sis based on the ratio of x-ray peak intensities. However, there are several experimental pitfalls which must be recognized in obtaining the desired x-ray intensities. Undesirable x-ray induced fluorescence of the specimen can result from various mechanisms and leads to x-ray intensities not characteristic of electron excitation and further results in incorrect intensity ratios.In measuring the x-ray intensity ratio for NiAl as a function of foil thickness, Zaluzec and Fraser (2) found the ratio was not constant for thicknesses where absorption could be neglected. They demonstrated that this effect originated from x-ray induced fluorescence by blocking the beam with lead foil. The primary x-rays arise in the illumination system and result in varying intensity ratios and a finite x-ray spectrum even when the specimen is not intercepting the electron beam, an ‘in-hole’ spectrum. We have developed a second technique for detecting x-ray induced fluorescence based on the magnitude of the ‘in-hole’ spectrum with different filament emission currents and condenser apertures.

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Scattering-angle dependence of signal/background ratio of inner-shell electron excitation loss in EELS

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100075701 ◽

1983 ◽

Vol 41 ◽

pp. 390-391

Author(s):

T. Oikawa ◽

M. Inoue ◽

T. Honda ◽

Y. Kokubo

Keyword(s):

Energy Loss ◽

Electron Excitation ◽

Heavy Elements ◽

Background Intensity ◽

Light Elements ◽

Energy Analyzer ◽

High Background ◽

Scattering Angle ◽

Angle Dependence ◽

Shell Electron

EELS allows us to make analysis of light elements such as hydrogen to heavy elements of microareas on the specimen. In energy loss spectra, however, elemental signals ride on a high background; therefore, the signal/background (S/B) ratio is very low in EELS. A technique which collects the center beam axial-symmetrically in the scattering angle is generally used to obtain high total intensity. However, the technique collects high background intensity together with elemental signals; therefore, the technique does not improve the S/B ratio. This report presents the experimental results of the S/B ratio measured as a function of the scattering angle and shows the possibility of the S/B ratio being improved in the high scattering angle range.Energy loss spectra have been measured using a JEM-200CX TEM with an energy analyzer ASEA3 at 200 kV.Fig.l shows a typical K-shell electron excitation edge riding on background in an energy loss spectrum.

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Electron Scattering in Solids

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133618 ◽

1990 ◽

Vol 48 (2) ◽

pp. 4-5

Author(s):

Ryuichi Shimizu ◽

Ze-Jun Ding

Keyword(s):

Monte Carlo Simulation ◽

Monte Carlo ◽

Angular Distribution ◽

Elastic Scattering ◽

Electron Scattering ◽

Cross Sections ◽

Expansion Method ◽

Electron Excitation ◽

Partial Wave Expansion ◽

Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

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EXELFS Studies of Carbon Fibers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100133953 ◽

1990 ◽

Vol 48 (2) ◽

pp. 72-73

Author(s):

V. Serin ◽

K. Hssein ◽

G. Zanchi ◽

J. Sévely

Keyword(s):

Carbon Fibers ◽

Energy Analysis ◽

Electron Excitation ◽

Complex Structures ◽

High Modulus ◽

Promising Technique ◽

X Ray ◽

Fine Structures ◽

X Ray Absorption

The present developments of electron energy analysis in the microscopes by E.E.L.S. allow an accurate recording of the spectra and of their different complex structures associated with the inner shell electron excitation by the incident electrons (1). Among these structures, the Extended Energy Loss Fine Structures (EXELFS) are of particular interest. They are equivalent to the well known EXAFS oscillations in X-ray absorption spectroscopy. Due to the EELS characteristic, the Fourier analysis of EXELFS oscillations appears as a promising technique for the characterization of composite materials, the major constituents of which are low Z elements. Using EXELFS, we have developed a microstructural study of carbon fibers. This analysis concerns the carbon K edge, which appears in the spectra at 285 eV. The purpose of the paper is to compare the local short range order, determined by this way in the case of Courtauld HTS and P100 ex-polyacrylonitrile carbon fibers, which are high tensile strength (HTS) and high modulus (HM) fibers respectively.

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Valence electron energy loss spectroscopy in reflection geometry

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100153865 ◽

1989 ◽

Vol 47 ◽

pp. 378-379

Author(s):

J. Liu ◽

J. M. Cowley

Keyword(s):

Energy Loss ◽

Valence Electron ◽

Interband Transition ◽

Specular Reflection ◽

Three Dimensional ◽

Electron Excitation ◽

Transmission Electron ◽

Yield Information ◽

Valence Bands ◽

Excitation Processes

The low energy loss region of a EELS spectrum carries information about the valence electron excitation processes (e.g., collective excitations for free electron like materials and interband transitions for insulators). The relative intensities and the positions of the interband transition energy loss peaks observed in EELS spectra are determined by the joint density of states (DOS) of the initial and final states of the excitation processes. Thus it is expected that EELS in reflection mode could yield information about the perturbation of the DOS of the conduction and valence bands of the bulk crystals caused by the termination of the three dimensional periodicity at the crystal surfaces. The experiments were performed in a Philipps 400T transmission electron microscope operated at 120 kV. The reflection EELS spectra were obtained by a Gatan 607 EELS spectrometer together with a Tracor data acquisition system and the resolution of the spectrometer was about 0.8 eV. All the reflection spectra are obtained from the specular reflection spots satisfying surface resonance conditions.

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Integration of Core-Edge Spectroscopy Methods for the Study of Polymers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010016323x ◽

1996 ◽

Vol 54 ◽

pp. 154-155

Author(s):

E. G. Rightor

Keyword(s):

Excited State ◽

Polymer Blends ◽

Gas Phase ◽

Spatial Resolution ◽

High Spatial Resolution ◽

Electronic States ◽

Core Electron ◽

Bulk Solids ◽

Development Application

Core edge spectroscopy methods are versatile tools for investigating a wide variety of materials. They can be used to probe the electronic states of materials in bulk solids, on surfaces, or in the gas phase. This family of methods involves promoting an inner shell (core) electron to an excited state and recording either the primary excitation or secondary decay of the excited state. The techniques are complimentary and have different strengths and limitations for studying challenging aspects of materials. The need to identify components in polymers or polymer blends at high spatial resolution has driven development, application, and integration of results from several of these methods.

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