Discrete conductance fluctuations in silicon emitter junctions due to defect clustering and evidence for structural changes by high‐energy electron irradiation and annealing
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2010 ◽
Vol 253
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pp. 012047
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2004 ◽
Vol 530
(1-2)
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pp. 110-116
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2006 ◽
Vol 52
(3)
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pp. 355-359
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2014 ◽
Vol 2
(27)
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pp. 4297-4309
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