Polarized Raman spectroscopic study of relaxed high density amorphous ices under pressure

2010 ◽  
Vol 133 (16) ◽  
pp. 164508 ◽  
Author(s):  
Yoshiharu Suzuki ◽  
Yasunori Tominaga
2017 ◽  
Vol 2017 ◽  
pp. 1-8 ◽  
Author(s):  
T. I. Milenov ◽  
E. Valcheva ◽  
V. N. Popov

We present here results on a Raman spectroscopic study of the deposited defected graphene on Si substrates by chemical vapor deposition (thermal decomposition of acetone). The graphene films are not deposited on the (001) Si substrate directly but on two types of interlayers of mixed phases unintentionally deposited on the substrates: а diamond-like carbon (designated here as DLC) and amorphous carbon (designated here as αC) are dominated ones. The performed thorough Raman spectroscopic study of as-deposited as well as exfoliated specimens by two different techniques using different excitation wavelengths (488, 514, and 613 nm) as well as polarized Raman spectroscopy establishes that the composition of the designated DLC layers varies with depth: the initial layers on the Si substrate consist of DLC, nanodiamond species, and C70 fullerenes while the upper ones are dominated by DLC with an occasional presence of C70 fullerenes. The αC interlayer is dominated by turbostratic graphite and contains a larger quantity of C70 than the DLC-designated interlayers. The results of polarized and unpolarized Raman spectroscopic studies of as-grown and exfoliated graphene films tend to assume that single- to three-layered defected graphene is deposited on the interlayers. It can be concluded that the observed slight upshift of the 2D band as well as the broadening of 2D band should be related to the strain and doping.


1993 ◽  
Vol 24 (8) ◽  
pp. 501-510 ◽  
Author(s):  
Bert J. Kip ◽  
Marnix van Gurp ◽  
Sef P. C. van Heel ◽  
Robert J. Meier

2021 ◽  
Vol 118 (13) ◽  
pp. 133101
Author(s):  
Sanghyun Kim ◽  
Donghyeon Lee ◽  
Binbin Wang ◽  
Shang-Jie Yu ◽  
Kenji Watanabe ◽  
...  

2021 ◽  
Vol 22 (10) ◽  
pp. 5380
Author(s):  
Boris A. Kolesov

The work outlines general ideas on how the frequency and the intensity of proton vibrations of X–H×××Y hydrogen bonding are formed as the bond evolves from weak to maximally strong bonding. For this purpose, the Raman spectra of different chemical compounds with moderate, strong, and extremely strong hydrogen bonds were obtained in the temperature region of 5 K–300 K. The dependence of the proton vibrational frequency is schematically presented as a function of the rigidity of O-H×××O bonding. The problems of proton dynamics on tautomeric O–H···O bonds are considered. A brief description of the N–H···O and C–H···Y hydrogen bonds is given.


1978 ◽  
Vol 9 (40) ◽  
Author(s):  
J. MEDEMA ◽  
C. VAN STAM ◽  
V. H. J. DE BEER ◽  
A. J. A. KONINGS ◽  
D. C. KONINGSBERGER

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